Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
YF

Yongfa Fan — 12 Patents

SYSynopsys: 8 patents #127 of 2,302Top 6%
Asml Netherlands B.V.: 2 patents #1,484 of 3,192Top 50%
Sunnyvale, CA: #2,336 of 14,302 inventorsTop 20%
California: #51,404 of 386,348 inventorsTop 15%
Overall (All Time): #396,045 of 4,157,543Top 10%
12 Patents All Time
Yongfa Fan has been granted 12 US patents while listed as an inventor at Synopsys. The first was granted in 2011 and the most recent in December 2025. Yongfa Fan ranks #396,045 of 4,157,543 US inventors in our database (top 9.5%). Patent records list Yongfa Fan in Sunnyvale, CA, US.

Issued Patents All Time

Showing 1–12 of 12 patents

Patent #TitleCo-InventorsDateApprox Value ⓘ
12505524 Method for training or using a process model for determining a pattern in a patterning process Ziyang MA, Jingcai Cheng, Ya Luo, Leiwu ZHENG, Xiaoni Guo +5 more 2025-12-23
12468232 Etch bias characterization and method of using the same Leiwu ZHENG, Mu FENG, Qian Qiu Zhao, Jen-Shiang Wang 2025-11-11
12339591 Determining metrics for a portion of a pattern on a substrate Jiao Huang, Yunan ZHENG, Qian Zhao, Jiao LIANG, Mu FENG 2025-06-24
11675274 Etch bias characterization and method of using the same Leiwu ZHENG, Mu FENG, Qian Zhao, Jen-Shiang Wang 2023-06-13 $78,743,000
8918743 Edge-based full chip mask topography modeling Qiliang Yan, Hongbo Zhang, Ebo Croffie, Lin Zhang, Peter Brooker +1 more 2014-12-23 $20,872,000
8875066 Performing image calculation based on spatial coherence Thomas Schmoeller 2014-10-28 $4,971,000
8812145 Modeling mask errors using aerial image sensitivity Jensheng Huang 2014-08-19 $5,859,000
8355807 Method and apparatus for using aerial image sensitivity to model mask errors Jensheng Huang 2013-01-15 $8,746,000
8296688 Evaluating the quality of an assist feature placement based on a focus-sensitive cost-covariance field Levi D. Barnes, Benjamin D. Painter, Qiliang Yan, Jianliang Li, Amyn A. Poonawala 2012-10-23 $3,027,000
8161424 Method and apparatus for modeling chemically amplified resists 2012-04-17 $2,222,000
8006203 Bulk image modeling for optical proximity correction Qiaolin Zhang, Bradley J. Falch 2011-08-23 $2,981,000
7954071 Assist feature placement based on a focus-sensitive cost-covariance field Levi D. Barnes, Benjamin D. Painter, Qiliang Yan, Jianliang Li, Amyn A. Poonawala 2011-05-31 $13,557,000