Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12339591 | Determining metrics for a portion of a pattern on a substrate | Jiao Huang, Yunan ZHENG, Qian Zhao, Yongfa Fan, Mu FENG | 2025-06-24 |
| 12182983 | Utilize machine learning in selecting high quality averaged SEM images from raw images automatically | Chen Zhang, Qiang Zhang, Jen-Shiang Wang | 2024-12-31 |
| 11567413 | Method for determining stochastic variation of printed patterns | Chang An Wang, Alvin Wang, Jen-Shiang Wang, Mu FENG | 2023-01-31 |
| 11422473 | Utilize pattern recognition to improve SEM contour measurement accuracy and stability automatically | Chen Zhang, Qiang Zhang, Yunbo Guo | 2022-08-23 |