Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8992791 | Method of cleaning semiconductor wafer and semiconductor wafer | Kazuaki Kozasa, Tomonori Kawasaki, Takahisa Sugiman | 2015-03-31 |
| 8728942 | Method for producing epitaxial silicon wafer | Shinichi Ogata, Kazushige Takaishi, Shigeru Okuuchi, Shunsuke Mikuriya, Yuichi Nakayoshi | 2014-05-20 |
| 8296961 | Polishing pad thickness measuring method and polishing pad thickness measuring device | Yuichi Nakayoshi, Hiroshi Takai | 2012-10-30 |