Issued Patents All Time
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8058181 | Method for post-etch cleans | David Chen, Yuh-Jia Su, Eddie Chiu, Maria Paola Pozzoli, Senzi Li +2 more | 2011-11-15 |
| 7569492 | Method for post-etch cleans | David Chen, Yuh-Jia Su, Eddie Chiu, Maria Paola Pozzoli, Senzi Li +2 more | 2009-08-04 |
| 7390755 | Methods for post etch cleans | David Chen, Yuh-Jia Su, Eddie Chiu, Maria Paola Pozzoli, Senzi Li +2 more | 2008-06-24 |
| 7288008 | Nonlithographic method of defining geometries for plasma and/or ion implantation treatments on a semiconductor wafer | Carmelo Romeo | 2007-10-30 |
| 7288427 | Method for reducing defects after a metal etching in semiconductor devices | Alessandro Spandre, Barbara Zanderighi | 2007-10-30 |
| 6998348 | Method for manufacturing electronic circuits integrated on a semiconductor substrate | Francesco Ciovacco, Roberto Colombo, Chiara Savardi | 2006-02-14 |
| 6638833 | Process for the fabrication of integrated devices with reduction of damage from plasma | Omar Vassalli | 2003-10-28 |
| 6495455 | Method for enhancing selectivity between a film of a light-sensitive material and a layer to be etched in electronic semiconductor device fabrication processes | Omar Vassalli | 2002-12-17 |
| 6233046 | Method of measuring the thickness of a layer of silicon damaged by plasma etching | Claudio Alfonso Giacomo Savoia, Enrico Bellandi, Francesca Canali | 2001-05-15 |
| 6051443 | Method for assessing the effects of plasma treatments on wafers of semiconductor material | Emilio Ghio, Andrea Colognese, Francois Maugain, Giovanni Rivera | 2000-04-18 |
| 5888836 | Process for the repair of floating-gate non-volatile memories damaged by plasma treatment | Emilio Ghio, Andrea Colognese | 1999-03-30 |