Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date | Approx Value ⓘ |
|---|---|---|---|---|
| 6313040 | Process for the definition of openings in a dielectric layer | Lorena Beghin, Francesco Cazzaniga, Luca Riva, Carmelo Romeo | 2001-11-06 | $47,399,000 |
| 6233046 | Method of measuring the thickness of a layer of silicon damaged by plasma etching | Simone Alba, Claudio Alfonso Giacomo Savoia, Enrico Bellandi | 2001-05-15 | $54,880,000 |