Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6313040 | Process for the definition of openings in a dielectric layer | Lorena Beghin, Francesco Cazzaniga, Luca Riva, Carmelo Romeo | 2001-11-06 |
| 6233046 | Method of measuring the thickness of a layer of silicon damaged by plasma etching | Simone Alba, Claudio Alfonso Giacomo Savoia, Enrico Bellandi | 2001-05-15 |