Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6051443 | Method for assessing the effects of plasma treatments on wafers of semiconductor material | Emilio Ghio, Simone Alba, Andrea Colognese, Francois Maugain | 2000-04-18 |
| 5985494 | Metrological structures particularly for direct measurement of errors introduced by alignment systems | Paolo Canestrari, Samuele Carrera | 1999-11-16 |
| 5622796 | Process for producing metrological structures particularly for direct measurement of errors introduced by alignment systems | Paolo Canestrari, Samuele Carrera | 1997-04-22 |
| 5246539 | Process for producing metrological structures particularly useful for analyzing the accuracy of instruments for measuring alignment on processed substrates | Paolo Canestrari, Carlo Lietti | 1993-09-21 |