DD

Didier Dutartre

SS Stmicroelectronics Sa: 36 patents #52 of 4,662Top 2%
SS Stmicroelectronics (Crolles 2) Sas: 17 patents #16 of 529Top 4%
SS Sgs-Thomson Microelectronics S.A.: 2 patents #359 of 957Top 40%
IBM: 1 patents #44,794 of 70,183Top 65%
SO Soitec: 1 patents #140 of 259Top 55%
CEA: 1 patents #3,381 of 7,956Top 45%
Overall (All Time): #59,298 of 4,157,543Top 2%
47
Patents All Time

Issued Patents All Time

Showing 25 most recent of 47 patents

Patent #TitleCo-InventorsDate
12211754 Semiconductor chip manufacturing method Pierpaolo Monge Roffarello, Isabella MICA, Alexandra Abbadie 2025-01-28
11978710 Integrated circuit comprising a substrate equipped with a trap-rich region, and fabricating process 2024-05-07
11757054 Integrated optical sensor with pinned photodiodes 2023-09-12
11562927 Method for forming an electrical contact between a semiconductor film and a bulk handle wafer, and resulting structure Jean-Pierre Carrere, Jean-Luc Huguenin, Clement Pribat, Sarah Kuster 2023-01-24
11075177 Integrated circuit comprising a substrate equipped with a trap-rich region, and fabricating process 2021-07-27
10978340 Method for forming an electrical contact between a semiconductor film and a bulk handle wafer, and resulting structure Jean-Pierre Carrere, Jean-Luc Huguenin, Clement Pribat, Sarah Kuster 2021-04-13
10658578 Memory cell comprising a phase-change material Pierre Morin 2020-05-19
10535552 Method for manufacture of a semiconductor wafer suitable for the manufacture of an SOI substrate, and SOI substrate wafer thus obtained Herve Jaouen 2020-01-14
10263110 Method of forming strained MOS transistors Remy BERTHELON, Pierre Morin, Francois Andrieu, Elise Baylac 2019-04-16
10262898 Method for forming an electrical contact between a semiconductor film and a bulk handle wafer, and resulting structure Jean-Pierre Carrere, Jean-Luc Huguenin, Clement Pribat, Sarah Kuster 2019-04-16
9929039 Method for manufacture of a semiconductor wafer suitable for the manufacture of an SOI substrate, and SOI substrate wafer thus obtained Herve Jaouen 2018-03-27
9759546 Method for measuring thickness variations in a layer of a multilayer semiconductor structure Oleg Kononchuk 2017-09-12
9711550 Pinned photodiode with a low dark current Laurent Favennec, Francois Roy 2017-07-18
9704903 Front-side imager having a reduced dark current on SOI substrate 2017-07-11
9312408 Imager having a reduced dark current through an increased bulk doping level 2016-04-12
8975730 Method for protection of a layer of a vertical stack and corresponding device Michel Marty, Sebastien Jouan 2015-03-10
8975154 Process for producing at least one deep trench isolation Zahra Aitfqirali-Guerry, Yves Campidelli, Denis Pellissier-Tanon 2015-03-10
8603887 Method for depositing a silicon oxide layer of same thickness on silicon and on silicon-germanium Nicolas L. Breil, Yves Campidelli, Olivier Gourhant 2013-12-10
8524522 Microelectronic device, in particular back side illuminated image sensor, and production process Michel Marty, Francois Roy, Pascal Besson, Jens Prima 2013-09-03
8168536 Realization of self-positioned contacts by epitaxy Philippe Coronel, Nicolas Loubet 2012-05-01
8158495 Process for forming a silicon-based single-crystal portion Laurent Rubaldo, Alexandre Talbot 2012-04-17
7906381 Method for integrating silicon-on-nothing devices with standard CMOS devices Nicolas Loubet, Stephane Monfray 2011-03-15
7892927 Transistor with a channel comprising germanium Stephane Monfray, Thomas Skotnicki, Alexandre Talbot 2011-02-22
7776745 Method for etching silicon-germanium in the presence of silicon Nicolas Loubet, Alexandre Talbot, Laurent Rubaldo 2010-08-17
7776679 Method for forming silicon wells of different crystallographic orientations Nicolas Loubet, Frederic Boeuf 2010-08-17