SM

Seung Chan Moon

SH Sk Hynix: 16 patents #452 of 4,849Top 10%
HE Hynix (Hyundai Electronics): 7 patents #80 of 1,604Top 5%
DC Dongjin Semichem Co.: 1 patents #83 of 252Top 35%
YC Young Chang Chemical Co.: 1 patents #10 of 11Top 95%
Overall (All Time): #186,154 of 4,157,543Top 5%
23
Patents All Time

Issued Patents All Time

Showing 1–23 of 23 patents

Patent #TitleCo-InventorsDate
7838201 Method for manufacturing a semiconductor device Jae Chang Jung, Cheol Kyu Bok, Chang Moon Lim 2010-11-23
7615338 Photoresist coating composition and method for forming fine pattern using the same Geun Su Lee, Seung Hun Lee 2009-11-10
7534548 Polymer for immersion lithography and photoresist composition Jae Chang Jung, Cheol Kyu Bok, Chang Moon Lim 2009-05-19
7494599 Method for fabricating fine pattern in semiconductor device Sung-Kwon Lee, Won-Kyu Kim 2009-02-24
7494935 Method for forming fine pattern of semiconductor device Jae Chang Jung, Cheol Kyu Bok, Myoung Ja Min, Keun Do Ban, Hee Youl Lim 2009-02-24
7462439 Top anti-reflective coating polymer, its preparation method and top anti-reflective coating composition comprising the same Jae Chang Jung, Cheol Kyu Bok, Chang Moon Lim 2008-12-09
7442648 Method for fabricating semiconductor device using tungsten as sacrificial hard mask Kwang-Ok Kim, Yun-Seok Cho, Jin-Ki Jung, Sung-Kwon Lee, Jun Sun +3 more 2008-10-28
7419760 Top anti-reflective coating composition, method for forming the pattern of a semiconductor device using the same, and semiconductor device comprising the pattern Jae Chang Jung, Cheol Kyu Bok, Sam Young Kim, Chang Moon Lim 2008-09-02
7381519 Top anti-reflective coating polymer, its preparation method and top anti-reflective coating composition comprising the same Jae Chang Jung, Cheol Kyu Bok, Chang Moon Lim 2008-06-03
7303858 Photoacid generating polymer, its preparation method, top anti-reflective coating composition comprising the same, method of forming a pattern in a semiconductor device, and semiconductor device Jae Chang Jung, Cheol Kyu Bok, Chang Moon Lim 2007-12-04
7288364 Top anti-reflective coating composition and method for pattern formation of semiconductor device using the same Jae Chang Jung, Cheol Kyu Bok, Sam Young Kim, Chang Moon Lim 2007-10-30
7238653 Cleaning solution for photoresist and method for forming pattern using the same Geun Su Lee, Cheol Kyu Bok, Young Sun Hwang, Sung Koo Lee, Ki Soo Shin 2007-07-03
7205089 Cross-linking polymer for organic anti-reflective coating, organic anti-reflective coating composition comprising the same and method for forming photoresist pattern using the same Jae Chang Jung, Cheol Kyu Bok, Ki Soo Shin 2007-04-17
7198887 Organic anti-reflective coating polymer, its preparation method and organic anti-reflective coating composition comprising the same Geun-soo Lee, Cheol Kyu Bok, Ki Soo Shin, Won-Wook Lee 2007-04-03
7022458 Photoresist polymer and photoresist composition containing the same Geun Su Lee, Cheol Kyu Bok, Ki Soo Shin, Jae-Hyun Kim, Jung Woo Kim +2 more 2006-04-04
6916594 Overcoating composition for photoresist and method for forming photoresist pattern using the same Cheol Kyu Bok, Jae Chang Jung, Ki Soo Shin 2005-07-12
5741625 Process for forming fine patterns in a semiconductor device utilizing multiple photosensitive film patterns and organic metal-coupled material Sang Man Bae 1998-04-21
5716758 Process for forming fine pattern for semiconductor device utilizing multiple interlaced exposure masks Sang Man Bae 1998-02-10
5705319 Process for forming fine patterns for a semiconductor device utilizing three photosensitive layers Sang Man Bae 1998-01-06
5650250 Light exposure mask for semiconductor devices 1997-07-22
5635335 Method for fabricating semiconductor device utilizing dual photoresist films imaged with same exposure mask Sang Man Bae 1997-06-03
5583069 Method for making a fine annular charge storage electrode in a semiconductor device using a phase-shift mask Chang Nam Ahn, Ik Boum Hur, Hung-Eil Kim, Il Ho Lee 1996-12-10
5157002 Method for forming a mask pattern for contact hole 1992-10-20