Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11270054 | Method and system for calculating printed area metric indicative of stochastic variations of the lithographic process | Hyejin Jin, John L. Sturtevant, Shumay D. Shang, Azat Latypov, Gurdaman Khaira | 2022-03-08 |
| 11194951 | Optical proximity correction model verification | Andrew Burbine | 2021-12-07 |
| 11061373 | Method and system for calculating probability of success or failure for a lithographic process due to stochastic variations of the lithographic process | Gurdaman Khaira, Azat Latypov, John L. Sturtevant, Yuri Granik | 2021-07-13 |
| 11023644 | Optical proximity correction modeling with density-based gauge weighting | Andrew Burbine, Christopher Heinz Clifford | 2021-06-01 |
| 10496780 | Dynamic model generation for lithographic simulation | Michael C. Lam, Ananthan Raghunathan, Konstantinos Adam, Christopher Heinz Clifford | 2019-12-03 |