Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11699017 | Die yield assessment based on pattern-failure rate simulation | Young-Chang Kim, John L. Sturtevant, Christopher Heinz Clifford | 2023-07-11 |
| 11194951 | Optical proximity correction model verification | Germain Louis Fenger | 2021-12-07 |
| 11023644 | Optical proximity correction modeling with density-based gauge weighting | Germain Louis Fenger, Christopher Heinz Clifford | 2021-06-01 |