Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12332565 | Thermosetting iodine- and silicon-containing material, composition containing the material for forming resist underlayer film for EUV lithography, and patterning process | Tsutomu Ogihara, Tsukasa Watanabe, Yusuke Biyajima, Ryo MITSUI | 2025-06-17 |
| 12174541 | Composition for forming silicon-containing resist underlayer film and patterning process | Tsutomu Ogihara, Yusuke Biyajima | 2024-12-24 |
| 12085857 | Composition for forming silicon-containing resist underlayer film and patterning process | Tsutomu Ogihara, Yusuke Biyajima | 2024-09-10 |
| 11914295 | Thermosetting iodine- and silicon-containing material, composition containing the material for forming resist underlayer film for EUV lithography, and patterning process | Tsutomu Ogihara, Tsukasa Watanabe, Yusuke Biyajima, Ryo MITSUI | 2024-02-27 |
| 11592287 | Method for measuring distance of diffusion of curing catalyst | Tsutomu Ogihara, Tsukasa Watanabe, Yoshio Kawai, Tomohiro Kobayashi, Yusuke Biyajima | 2023-02-28 |
| 11480879 | Composition for forming silicon-containing resist underlayer film and patterning process | Tsutomu Ogihara, Tsukasa Watanabe, Yusuke Biyajima | 2022-10-25 |
| 11385544 | Composition for forming silicon-containing resist underlayer film and patterning process | Tsutomu Ogihara, Yusuke Biyajima, Tsukasa Watanabe, Masaki Ohashi | 2022-07-12 |
| 6720288 | Herbicidal compositions and method of using the same | Tsutomu Mabuchi, Takashi Ohtsuka, Sumitaka Kose | 2004-04-13 |
| 4581946 | Instrumental error compensation circuit for flow meter | — | 1986-04-15 |