Issued Patents All Time
Showing 26–50 of 62 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7173872 | Method and apparatus for controlling a high voltage generator in a wafer burn-in test | Choong-Sun Park, Hyung-Dong Kim, Jong-Hyun Choi, Yong Hwan Jung | 2007-02-06 |
| 7161407 | Fuse circuit with controlled fuse burn out and method thereof | Jong Hoon Kim | 2007-01-09 |
| 7116127 | Circuit with fuse and semiconductor device having the same circuit | Young Hee Jung | 2006-10-03 |
| 7075854 | Semiconductor memory device, write control circuit and write control method for the same | Sei-Hui Lee | 2006-07-11 |
| 7057217 | Fuse arrangement and integrated circuit device using the same | Jong-Hyun Choi, Sang-Ki Hwang | 2006-06-06 |
| 7016248 | Method and apparatus for controlling a high voltage generator in a wafer burn-in test | Choong-Sun Park, Hyung-Dong Kim, Jong-Hyun Choi, Yong Hwan Jung | 2006-03-21 |
| 6972612 | Semiconductor device with malfunction control circuit and controlling method thereof | Kyeong-Seon Shin, Ki-Sang Kang | 2005-12-06 |
| 6909654 | Bit line pre-charge circuit of semiconductor memory device | Jae-Hoon Joo, Jin Seok Lee, Kyu-Chan Lee, Byung-Heon Kwak, Byung-Chul Kim | 2005-06-21 |
| 6906545 | Voltage measurement device tolerant of undershooting or overshooting input voltage of pad | Young Hee Jung | 2005-06-14 |
| 6898139 | Integrated circuit memory devices and operating methods that are configured to output data bits at a lower rate in a test mode of operation | Jae Woong Lee, Chi-Wook Kim | 2005-05-24 |
| 6861682 | Laser link structure capable of preventing an upper crack and broadening an energy window of a laser beam, and fuse box using the same | Jeong-Ho Bang, Kyeong-Seon Shin, Ho-Jeong Choi, Hyen-wook Ju, Kwang-kyu Bang | 2005-03-01 |
| 6850450 | Fuse box including make-link and redundant address decoder having the same, and method for repairing defective memory cell | Kwang-kyu Bang, Kyeong-Seon Shin, Hyen-wook Ju, Jeong-Ho Bang, Ho-Jeong Choi | 2005-02-01 |
| 6788132 | Voltage and time control circuits | Kyu-Nam Lim, Seong-Jin Jang | 2004-09-07 |
| 6751148 | Circuit for generating control signal using make-link type fuse | — | 2004-06-15 |
| 6658612 | Test signal generating circuit of a semiconductor device with pins receiving signals of multiple voltage levels and method for invoking test modes | Cheol-Hong Park, Jong-Hyun Choi | 2003-12-02 |
| 6643191 | Semiconductor device having chip selection circuit and method of generating chip selection signal | Yun-Sang Lee, Jong-Hyun Choi | 2003-11-04 |
| 6522597 | Semiconductor memory device and bit line isolation gate arrangement method thereof | Jong-Hyun Choi, Jae-Hoon Joo | 2003-02-18 |
| 6498526 | Fuse circuit and program status detecting method thereof | Kyu-Nam Lim | 2002-12-24 |
| 6490222 | Decoding circuit for controlling activation of wordlines in a semiconductor memory device | Jong-Hyun Choi, Jei-Hwan Yoo, Jae-Hoon Joo | 2002-12-03 |
| 6483373 | Input circuit having signature circuits in parallel in semiconductor device | Jong-Hyoung Lim, Hyun Seok Lee | 2002-11-19 |
| 6459636 | Mode selection circuit for semiconductor memory device | Yun-Sang Lee, Kyu-Nam Lim, Jong-Hyun Choi | 2002-10-01 |
| 6452828 | Dynamic random access memory (DRAM) having a structure for emplying a word line low voltage | Jong-Hyun Choi, Jong-Eon Lee | 2002-09-17 |
| 6438042 | Arrangement of bitline boosting capacitor in semiconductor memory device | Yun-Sang Lee, Jong-Hyun Choi, Jae-Hoon Joo | 2002-08-20 |
| 6396756 | Integrated circuit memory devices including transmission parts that are adjacent input/output selection parts | Jae-Hoon Joo, Young-Ok Cho | 2002-05-28 |
| 6392938 | Semiconductor memory device and method of identifying programmed defective address thereof | Jong-Hyun Choi, Yun-Sang Lee | 2002-05-21 |