Issued Patents All Time
Showing 1–25 of 36 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7336121 | Negative voltage generator for a semiconductor memory device | Jae-Yoon Sim | 2008-02-26 |
| 7106127 | Temperature sensor and method for detecting trip temperature of a temperature sensor | Jae-Yoon Sim | 2006-09-12 |
| 7023262 | Negative voltage generator for a semiconductor memory device | Jae-Yoon Sim | 2006-04-04 |
| 6937087 | Temperature sensor and method for detecting trip temperature of a temperature sensor | Jae-Yoon Sim | 2005-08-30 |
| 6927488 | Semiconductor memory device | Byung-Chul Kim, Won-Il Bae | 2005-08-09 |
| 6845049 | Semiconductor memory device including a delaying circuit capable of generating a delayed signal with a substantially constant delay time | Kyu-Nam Lim, Young Gu Kang, Jong Won Lee, Jae-Yoon Shim | 2005-01-18 |
| 6829189 | Semiconductor memory device and bit line sensing method thereof | Kyu-Nam Lim, Young Gu Kang, Jae-Yoon Shim | 2004-12-07 |
| 6590237 | Layout structure for dynamic random access memory | — | 2003-07-08 |
| 6560158 | Power down voltage control method and apparatus | Jong-Hyun Choi, Jong-Eon Lee, Hyun-Soon Jang | 2003-05-06 |
| 6545923 | Negatively biased word line scheme for a semiconductor memory device | Jae-Yoon Sim | 2003-04-08 |
| 6510096 | Power down voltage control method and apparatus | Jong-Hyun Choi, Jong-Eon Lee, Hyun-Soon Jang | 2003-01-21 |
| 6490222 | Decoding circuit for controlling activation of wordlines in a semiconductor memory device | Jong-Hyun Choi, Sang-Seok Kang, Jae-Hoon Joo | 2002-12-03 |
| 6456555 | Voltage detecting circuit for semiconductor memory device | Jae-Yoon Sim | 2002-09-24 |
| 6424578 | Voltage detecting circuit for semiconductor memory device | Jae-Yoon Sim | 2002-07-23 |
| 6400620 | Semiconductor memory device with burn-in test function | — | 2002-06-04 |
| 6335897 | Semiconductor memory device including redundancy circuit adopting latch cell | — | 2002-01-01 |
| 6252263 | Layout structure for dynamic random access memory | — | 2001-06-26 |
| 6252808 | Semiconductor memory device having improved row redundancy scheme and method for curing defective cell | — | 2001-06-26 |
| 6178109 | Integrated circuit memory devices having reduced susceptibility to reference voltage signal noise | Ho-Sung Song | 2001-01-23 |
| 6151264 | Integrated circuit memory devices including a single data shift block between first and second memory banks | — | 2000-11-21 |
| 6064601 | Integrated circuit memory devices and controlling methods that simultaneously activate multiple column select lines during a write cycle of a parallel bit test mode | Byung-Chul Kim | 2000-05-16 |
| 5970002 | Semiconductor memory device having redundancy function | — | 1999-10-19 |
| 5940343 | Memory sub-word line driver operated by unboosted voltage | Gi-Won Cha, Hoon Choi | 1999-08-17 |
| 5928373 | High speed test circuit for a semiconductor memory device | — | 1999-07-27 |
| 5907514 | Circuit and method for controlling a redundant memory cell in an integrated memory circuit | Jae Woong Lee | 1999-05-25 |