JL

Jong-Hyoung Lim

Samsung: 35 patents #3,282 of 75,807Top 5%
Overall (All Time): #99,023 of 4,157,543Top 3%
35
Patents All Time

Issued Patents All Time

Showing 25 most recent of 35 patents

Patent #TitleCo-InventorsDate
10431320 Semiconductor memory device, method of testing the same and method of operating the same Hyung-Shin Kwon, Chang-Soo Lee, Chung-Ki Lee 2019-10-01
9159398 Memory core and semiconductor memory device including the same Jung-Il Mok, Dae Sun Kim, Ji Hyun Lee 2015-10-13
9053963 Multiple well bias memory Chung-Ki Lee, Hong-Sun Hwang, Hyung-Shin Kwon 2015-06-09
8987867 Wafer and method of manufacturing the same Ji Hyun Lee 2015-03-24
8619484 Semiconductor device, method of adjusting load capacitance for the same, and semiconductor system including the same Sang-Seok Kang, Hyung-Shin Kwon 2013-12-31
8411520 Semiconductor memory device and method of reducing consumption of standby current therein Myung-Jae Lee, Sang-Seok Kang 2013-04-02
8228736 Mobile system on chip (SoC) and mobile terminal using the mobile SoC, and method for refreshing a memory in the mobile SoC Jae-Hoon Joo, Sang-Seok Kang 2012-07-24
8144539 Semiconductor memory device for self refresh and memory system having the same Sang-Seok Kang 2012-03-27
8015459 Semiconductor memory device and method of performing a memory operation Sang-Seok Kang 2011-09-06
7940589 Bit line sense amplifier of semiconductor memory device and control method thereof Ji Hun Lee 2011-05-10
7747912 Semiconductor memory device capable of arbitrarily setting the number of memory cells to be tested and related test method Sang-Man Byun, Sang Cheol Kim, Gwan-pyo Hong 2010-06-29
7675316 Semiconductor memory device including on die termination circuit and on die termination method thereof Sang-Seok Kang 2010-03-09
7656741 Row active time control circuit and a semiconductor memory device having the same Ji Hyun Lee 2010-02-02
7657800 Semiconductor memory device and method of performing a memory operation Sang-Seok Kang 2010-02-02
7646665 Semiconductor memory device and burn-in test method thereof Dae Sun Kim, Sang-ki Son 2010-01-12
7639547 Semiconductor memory device for independently controlling internal supply voltages and method of using the same Jang Won Moon, Young-Hyun Jun 2009-12-29
7612573 Probe sensing pads and methods of detecting positions of probe needles relative to probe sensing pads Kun-Up Kim, Chang Sik Kim, Doo-Seon Lee 2009-11-03
7554866 Circuit and method of controlling input/output sense amplifier of a semiconductor memory device Jang Won Moon 2009-06-30
7466616 Bit line sense amplifier and method thereof Sang-Man Byun, Sang-Seok Kang 2008-12-16
7397715 Semiconductor memory device for testing redundancy cells Sang-Man Byun 2008-07-08
7391254 Circuit and method of generating internal supply voltage in semiconductor memory device Sang-Seok Kang, Sang-Man Byun 2008-06-24
7184340 Circuit and method for test mode entry of a semiconductor memory device 2007-02-27
7054204 Semiconductor device and method for controlling the same Hyuk-Joon Kwon, Hyun Kyu Lee 2006-05-30
6937534 Integrated circuit memory device including delay locked loop circuit and delay locked loop control circuit and method of controlling delay locked loop circuit Hui-kyung Sung 2005-08-30
6822490 Data output circuit for reducing skew of data signal Dong-ho Hyun 2004-11-23