HP

Hyun-Mog Park

Samsung: 29 patents #4,224 of 75,807Top 6%
IN Intel: 18 patents #2,286 of 30,777Top 8%
📍 Suwon-si, OR: #6 of 20 inventorsTop 30%
Overall (All Time): #59,875 of 4,157,543Top 2%
47
Patents All Time

Issued Patents All Time

Showing 26–47 of 47 patents

Patent #TitleCo-InventorsDate
10396035 Three-dimensional semiconductor device having contact plugs penetrating upper adjacent electrodes 2019-08-27
10325992 Semiconductor device and method of manufacturing the same Eunae Cho, Dongjin Lee, Ji Eun Lee, Kyoung-Ho Jung, Dong Su Ko +8 more 2019-06-18
9202819 Three-dimensional semiconductor memory devices and methods of fabricating the same Juyul Lee, Bumsu Kim, Kwangmin Park, Jae Young Ahn, Dongchul Yoo +2 more 2015-12-01
7675125 NAND-type nonvolatile memory device and related method of manufacture Seung-Jun Lee, Hyun Jung Kim 2010-03-09
7544896 Forming a porous dielectric layer and structures formed thereby Boyan Boyanov, Grant Kloster, Vijay Ramachandrarao 2009-06-09
7335586 Sealing porous dielectric material using plasma-induced surface polymerization Vijayakumar Ramachandrarao, Boyan Boyanov, Grant Kloster 2008-02-26
7332406 Air gap interconnect structure and method Grant Kloster 2008-02-19
7303648 Via etch process Vijayakumar Ramachandrarao 2007-12-04
7238604 Forming thin hard mask over air gap or porous dielectric Grant Kloster, Kevin P. O'Brien, David H. Gracias, Vijayakumar Ramachandrarao 2007-07-03
7220668 Method of patterning a porous dielectric material Boyan Boyanov, Grant Kloster, Vijayakumar Ramachandrarao 2007-05-22
7179755 Forming a porous dielectric layer and structures formed thereby Boyan Boyanov, Grant Kloster, Vijay Ramachandrarao 2007-02-20
7176122 Dielectric with sidewall passivating layer 2007-02-13
7151051 Interconnect structure for an integrated circuit and method of fabrication Jun He, Jose Maiz 2006-12-19
7049053 Supercritical carbon dioxide to reduce line edge roughness Vijayakumar Ramachandrarao, Subramanyam Iyer, Bob Turkot 2006-05-23
6919637 Interconnect structure for an integrated circuit and method of fabrication Jun He, Jose Maiz 2005-07-19
6903461 Semiconductor device having a region of a material which is vaporized upon exposing to ultraviolet radiation Grant Kloster, Jihperng Leu 2005-06-07
6867125 Creating air gap in multi-level metal interconnects using electron beam to remove sacrificial material Grant Kloster, Jihperng Leu 2005-03-15
6861332 Air gap interconnect method Grant Kloster 2005-03-01
6774032 Method of making a semiconductor device by forming a masking layer with a tapered etch profile 2004-08-10
6743712 Method of making a semiconductor device by forming a masking layer with a tapered etch profile Jihperng Leu, Chih-I Wu 2004-06-01
6734094 Method of forming an air gap within a structure by exposing an ultraviolet sensitive material to ultraviolet radiation Grant Kloster, Jihperng Leu 2004-05-11
6620741 Method for controlling etch bias of carbon doped oxide films David H. Gracias, Vijayakumar Ramachandrarao 2003-09-16