Issued Patents All Time
Showing 1–20 of 20 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8357933 | Manufacturing method of semiconductor integrated circuit device | Akio Hasebe, Hideyuki Matsumoto, Shingo Yorisaki, Masayoshi Okamoto, Yasunori Narizuka +1 more | 2013-01-22 |
| 8323992 | Method of manufacturing semiconductor integrated circuit device | Seigo Nakamura, Iwao Natori | 2012-12-04 |
| 8206997 | Method of manufacturing a semiconductor integrated circuit device and a method of manufacturing a thin film probe sheet for using the same | Akio Hasebe, Yasunori Narizuka, Seigo Nakamura, Kenji Kawakami | 2012-06-26 |
| 8062911 | Method of manufacturing a semiconductor integrated circuit device and a method of manufacturing a thin film probe sheet for using the same | Akio Hasebe, Yasunori Narizuka, Seigo Nakamura, Kenji Kawakami | 2011-11-22 |
| 7901958 | Fabrication method of semiconductor integrated circuit device | Masayoshi Okamoto, Yoshiaki Hasegawa, Hideyuki Matsumoto, Shingo Yorisaki, Akio Hasebe +4 more | 2011-03-08 |
| 7776626 | Manufacturing method of semiconductor integrated circuit device | Akio Hasebe, Hideyuki Matsumoto, Shingo Yorisaki, Masayoshi Okamoto, Yasunori Narizuka +1 more | 2010-08-17 |
| 7688086 | Fabrication method of semiconductor integrated circuit device and probe card | Yoshimi Horigome, Seigo Nakamura, Iwao Natori | 2010-03-30 |
| 7598100 | Manufacturing method of semiconductor integrated circuit device | Hideyuki Matsumoto, Shingo Yorisaki, Akio Hasebe, Masayoshi Okamoto, Yasunori Narizuka | 2009-10-06 |
| 7537943 | Method of manufacturing a semiconductor integrated circuit device | Akio Hasebe, Yasunori Narizuka, Seigo Nakamura | 2009-05-26 |
| 7517707 | Manufacturing method of semiconductor integrated circuit device and probe card | Masayoshi Okamoto, Hideyuki Matsumoto, Shingo Yorisaki, Akio Hasebe, Akira Shimase | 2009-04-14 |
| 7407823 | Manufacturing method of semiconductor integrated circuit device | Akio Hasebe, Masayoshi Okamoto, Yasunori Narizuka, Shingo Yorisaki | 2008-08-05 |
| 7351597 | Fabrication method of semiconductor integrated circuit device | Yuji Wada, Susumu Kasukabe, Takehiko Hasebe, Yasunori Narizuka, Akira Yabushita +4 more | 2008-04-01 |
| 7271015 | Manufacturing method of semiconductor integrated circuit device and probe card | Masayoshi Okamoto, Hideyuki Matsumoto, Shingo Yorisaki, Akio Hasebe, Akira Shimase | 2007-09-18 |
| 7235413 | Fabrication method of semiconductor integrated circuit device | Akio Hasebe, Yasunori Narizuka, Teruo Shoji | 2007-06-26 |
| 7219422 | Fabrication method of semiconductor integrated circuit device | Yuji Wada, Susumu Kasukabe, Takehiko Hasebe, Yasunori Narizuka, Akira Yabushita +4 more | 2007-05-22 |
| 7198962 | Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test step | Ryuji Kohno, Tetsuo Kumazawa, Makoto Kitano, Akihiko Ariga, Yuji Wada +7 more | 2007-04-03 |
| 6696849 | Fabrication method of semiconductor integrated circuit device and its testing apparatus | Naoto Ban, Masaaki Namba, Akio Hasebe, Yuji Wada, Ryuji Kohno +1 more | 2004-02-24 |
| 6566150 | Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test step | Ryuji Kohno, Tetsuo Kumazawa, Makoto Kitano, Akihiko Ariga, Yuji Wada +7 more | 2003-05-20 |
| 6455335 | Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test step | Ryuji Kohno, Tetsuo Kumazawa, Makoto Kitano, Akihiko Ariga, Yuji Wada +7 more | 2002-09-24 |
| 6197603 | Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test step | Ryuji Kohno, Tetsuo Kumazawa, Makoto Kitano, Akihiko Ariga, Yuji Wada +7 more | 2001-03-06 |