Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8357933 | Manufacturing method of semiconductor integrated circuit device | Akio Hasebe, Hideyuki Matsumoto, Yasuhiro Motoyama, Masayoshi Okamoto, Yasunori Narizuka +1 more | 2013-01-22 |
| 7901958 | Fabrication method of semiconductor integrated circuit device | Masayoshi Okamoto, Yoshiaki Hasegawa, Yasuhiro Motoyama, Hideyuki Matsumoto, Akio Hasebe +4 more | 2011-03-08 |
| 7776626 | Manufacturing method of semiconductor integrated circuit device | Akio Hasebe, Hideyuki Matsumoto, Yasuhiro Motoyama, Masayoshi Okamoto, Yasunori Narizuka +1 more | 2010-08-17 |
| 7598100 | Manufacturing method of semiconductor integrated circuit device | Hideyuki Matsumoto, Akio Hasebe, Yasuhiro Motoyama, Masayoshi Okamoto, Yasunori Narizuka | 2009-10-06 |
| 7517707 | Manufacturing method of semiconductor integrated circuit device and probe card | Masayoshi Okamoto, Hideyuki Matsumoto, Akio Hasebe, Yasuhiro Motoyama, Akira Shimase | 2009-04-14 |
| 7407823 | Manufacturing method of semiconductor integrated circuit device | Akio Hasebe, Masayoshi Okamoto, Yasunori Narizuka, Yasuhiro Motoyama | 2008-08-05 |
| 7271015 | Manufacturing method of semiconductor integrated circuit device and probe card | Masayoshi Okamoto, Hideyuki Matsumoto, Akio Hasebe, Yasuhiro Motoyama, Akira Shimase | 2007-09-18 |
| 5219765 | Method for manufacturing a semiconductor device including wafer aging, probe inspection, and feeding back the results of the inspection to the device fabrication process | Toru Yoshida, Suguru Sakaguchi, Aizo Kaneda, Kooji Serizawa, Munehisa Kishimoto +3 more | 1993-06-15 |