Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Pattern inspecting and measuring device and program

Pattern inspecting and measuring device and program

US Patent 9858659 · Granted Jan 2, 2018

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Operation plan change assistance device, operation plan change assistance method2025
Pattern inspection/measurement device, and pattern inspection/measurement progra2025
Pattern measurement device2025
Image recognition system2025
System for generating image, and non-transitory computer-readable medium2025
Capacitive touch panel and display device2025
Training method for learning apparatus, and image generation system2025
Service plan change assistance apparatus, decision model creation apparatus, dec2025
Image processing program, image processing device, and image processing method2025
Image processing program, image processing device, and image processing method2025
Image processing program, image processing device, and image processing method2025
Computer-readable recording medium storing information processing program, metho2025