Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Methods and system for analysis and management of parametric yield

Methods and system for analysis and management of parametric yield

US Patent 8997028 · Granted Mar 31, 2015

Estimated economic value: $6,306,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Short circuit detection in a read/write assist capacitor of a memory2025
Device mismatch mitigation for medium range and beyond distances2025
Exploratory data interface2024
Stacked via rivets in chip hotspots2022
Multi-mode design and operation for transistor mismatch immunity2022
Circuit layout similarity metric for semiconductor testsite coverage2020
Optimizing integrated circuit designs based on interactions between multiple int2020
Optimizing integrated circuit designs based on interactions between multiple int2020
Deep trench floorplan distribution design methodology for semiconductor manufact2020
Optimizing integrated circuit designs based on interactions between multiple int2020
Optimizing integrated circuit designs based on interactions between multiple int2020
Defect discrimination apparatus, methods, and systems2019