Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Examination of a hole formed in a semiconductor specimen

Examination of a hole formed in a semiconductor specimen

US Patent 12347734 · Granted Jul 1, 2025

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Reconstruction of a distorted image of an array of structural elements of a spec2025
Control of a manufacturing process using contour curvature analysis of specimens2025
Control of a manufacturing process using contour curvature analysis of specimens2025
Identification of an array in a semiconductor specimen2025
Detection of defects using a computationally efficient segmentation approach2025
Detection of defects using a computationally efficient segmentation approach2025
Geometry based three dimensional reconstruction of a semiconductor specimen by s2024
Lateral recess measurement in a semiconductor specimen2024
Reconstruction of a distorted image of an array of structural elements of a spec2023
Determining a critical dimension variation of a pattern2023
Determining a critical dimension variation of a pattern2023
Local shape deviation in a semiconductor specimen2023