Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Granular dynamic test systems and methods

Granular dynamic test systems and methods

US Patent 10545189 · Granted Jan 28, 2020

Estimated economic value: $379,153,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Dynamically configurable system-on-chip network2025
Technique for enabling on-die noise measurement during ate testing and IST2025
Technique for enabling on-die noise measurement during ate testing and IST2025
Test data transfer in multi-die systems2025
Asynchronous in-system testing for autonomous systems and applications2025
Asynchronous in-system testing for autonomous systems and applications2025
Asynchronous in-system testing for autonomous systems and applications2025
Leveraging low power states for fault testing of processing cores at runtime2024
In system test of chips in functional systems2024
Techniques for testing semiconductor devices2024
Techniques for isolating interfaces while testing semiconductor devices2024
Techniques for isolating interfaces while testing semiconductor devices2024