| 12291219 |
Asynchronous in-system testing for autonomous systems and applications |
Anitha Kalva, Jae Wu, Shantanu Sarangi, Sailendra Chadalavada, Chen Fang +1 more |
2025-05-06 |
| 11668750 |
Performing testing utilizing staggered clocks |
Sailendra Chadalavada, Venkat Abilash Reddy Nerallapally, Jaison Daniel Kurien, Bonita Bhaskaran, Shantanu Sarangi +1 more |
2023-06-06 |
| 10890620 |
On-chip execution of in-system test utilizing a generalized test image |
Shantanu Sarangi, Sailendra Chadalavada, Sumit Raj, Rangavajjula Kameswara Naga Mahesh, Jayesh Kumar Pandey +1 more |
2021-01-12 |
| 10746798 |
Field adaptable in-system test mechanisms |
Sailendra Chadalavada, Shantanu Sarangi, Sunil Bhavsar, Jue Wu, Bonita Bhaskaran +2 more |
2020-08-18 |
| 10545189 |
Granular dynamic test systems and methods |
Amit Sanghani, Jonathon E. Colburn, Bala Tarun Nelapatla, Shantanu Sarangi, Rajendra Kumar reddy.S +1 more |
2020-01-28 |
| 10481203 |
Granular dynamic test systems and methods |
Shantanu Sarangi, Adarsh Kalliat Balagopala, Amit Sanghani |
2019-11-19 |
| 10473720 |
Dynamic independent test partition clock |
Pavan Kumar Datla Jagannadha, Dheepakkumaran Jayaraman, Anubhav Sinha, Karthikeyan Natarajan, Shantanu Sarangi +2 more |
2019-11-12 |
| 10451676 |
Method and system for dynamic standard test access (DSTA) for a logic block reuse |
Amit Sanghani, Shantanu Sarangi, Jonathon E. Colburn, Bala Tarun Nelapatla, Sailendra Chadalavda +3 more |
2019-10-22 |
| 10444280 |
Independent test partition clock coordination across multiple test partitions |
Dheepakkumaran Jayaraman, Karthikeyan Natarajan, Shantanu Sarangi, Amit Sanghani, Sailendra Chadalavda +4 more |
2019-10-15 |
| 10317463 |
Scan system interface (SSI) module |
Amit Sanghani, Jonathon E. Colburn, Rajendra Kumar reddy.S, Bala Tarun Nelapatla, Sailendra Chadalavda +1 more |
2019-06-11 |
| 10281524 |
Test partition external input/output interface control for test partitions in a semiconductor |
Sailendra Chadalavda, Shantanu Sarangi, Amit Sanghani, Jonathon E. Colburn, Dan Tobin Smith +2 more |
2019-05-07 |
| 9885753 |
Scan systems and methods |
Amit Sanghani, Farideh Golshan, Venkata Kottapalli, Ketan Kulkarni |
2018-02-06 |
| 9829536 |
Performing on-chip partial good die identification |
Jonathon E. Colburn, Amit Sanghani |
2017-11-28 |
| 9395414 |
System for reducing peak power during scan shift at the local level for scan based tests |
Satya Puvvada, Amit Sanghani |
2016-07-19 |
| 9377510 |
System for reducing peak power during scan shift at the global level for scan based tests |
Satya Puvvada, Amit Sanghani |
2016-06-28 |
| 9222981 |
Global low power capture scheme for cores |
Satya Puvvada, Amit Sanghani, Anubhav Sinha, Vishal Agarwal |
2015-12-29 |
| 7334172 |
Transition fault detection register with extended shift mode |
Michael D. Howard, Jonjen Sern, Vicky Wu |
2008-02-19 |
