| 10545189 |
Granular dynamic test systems and methods |
Milind Sonawane, Amit Sanghani, Bala Tarun Nelapatla, Shantanu Sarangi, Rajendra Kumar reddy.S +1 more |
2020-01-28 |
| 10451676 |
Method and system for dynamic standard test access (DSTA) for a logic block reuse |
Milind Sonawane, Amit Sanghani, Shantanu Sarangi, Bala Tarun Nelapatla, Sailendra Chadalavda +3 more |
2019-10-22 |
| 10444280 |
Independent test partition clock coordination across multiple test partitions |
Dheepakkumaran Jayaraman, Karthikeyan Natarajan, Shantanu Sarangi, Amit Sanghani, Milind Sonawane +4 more |
2019-10-15 |
| 10317463 |
Scan system interface (SSI) module |
Milind Sonawane, Amit Sanghani, Rajendra Kumar reddy.S, Bala Tarun Nelapatla, Sailendra Chadalavda +1 more |
2019-06-11 |
| 10281524 |
Test partition external input/output interface control for test partitions in a semiconductor |
Sailendra Chadalavda, Shantanu Sarangi, Milind Sonawane, Amit Sanghani, Dan Tobin Smith +2 more |
2019-05-07 |
| 9829536 |
Performing on-chip partial good die identification |
Milind Sonawane, Amit Sanghani |
2017-11-28 |