Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Test partition external input/output interface control for test partitions in a semiconductor

Test partition external input/output interface control for test partitions in a semiconductor

US Patent 10281524 · Granted May 7, 2019

Estimated economic value: $354,459,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Technique for enabling on-die noise measurement during ate testing and IST2025
Technique for enabling on-die noise measurement during ate testing and IST2025
Test data transfer in multi-die systems2025
Test data transfer in multi-die systems2025
Electronic device with graphical user interface2025
Asynchronous in-system testing for autonomous systems and applications2025
Asynchronous in-system testing for autonomous systems and applications2025
Test data authentication and processing using scalable data structures2025
Performing diagnostic operations on a target system2025
System for automated data retrieval from an integrated circuit for event analysi2025
Electronic device with graphical user interface2025
Leveraging low power states for fault testing of processing cores at runtime2024