Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › In system test of chips in functional systems

In system test of chips in functional systems

US Patent 12078678 · Granted Sep 3, 2024

Estimated economic value: $4,747,919,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Technique for enabling on-die noise measurement during ate testing and IST2025
Memory device2025
Method of forming phase-change memory layers on recessed electrodes2025
Test data transfer in multi-die systems2025
Asynchronous in-system testing for autonomous systems and applications2025
Asynchronous in-system testing for autonomous systems and applications2025
System and method for dynamic voltage control2025
Leveraging low power states for fault testing of processing cores at runtime2024
Techniques for testing semiconductor devices2024
Techniques for isolating interfaces while testing semiconductor devices2024
In-system test of chips in functional systems2023
In-system test of chips in functional systems2023