Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Dynamic independent test partition clock

Dynamic independent test partition clock

US Patent 10473720 · Granted Nov 12, 2019

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Technique for enabling on-die noise measurement during ate testing and IST2025
Technique for enabling on-die noise measurement during ate testing and IST2025
Test data transfer in multi-die systems2025
Test data transfer in multi-die systems2025
Protection of virtual private cloud configurations2025
Asynchronous in-system testing for autonomous systems and applications2025
Asynchronous in-system testing for autonomous systems and applications2025
Test data authentication and processing using scalable data structures2025
Device under test synchronization with automated test equipment check cycle2024
Leveraging low power states for fault testing of processing cores at runtime2024
In system test of chips in functional systems2024
Techniques for testing semiconductor devices2024