Issued Patents All Time
Showing 1–25 of 36 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11591109 | Abnormality detection device and control device | Kenichi Yamamoto | 2023-02-28 |
| 9572375 | Vapor-permeable waterproof sock | Ichiro SHINGA | 2017-02-21 |
| 8837267 | Method for recording and reproducing a holographic read only recording medium, and holographic read only recording medium | Takehiro Shimizu, Kazuyoshi Masaki | 2014-09-16 |
| 8415762 | Semiconductor device for performing photoelectric conversion | Yoshinori Yoshida, Tatsuya Tominari | 2013-04-09 |
| 8217367 | Scanner device for scanning probe microscope | Takeshi Fukuma, Yasutaka Okazaki | 2012-07-10 |
| 8065908 | Scan type probe microscope | Takayuki Uchihashi, Hayato Yamashita | 2011-11-29 |
| 7975315 | Atomic force microscope | Takayuki Uchihashi, Noriyuki Kodera, Naohisa Takahashi | 2011-07-05 |
| 7975314 | Scanning probe microscope and active damping drive control device | — | 2011-07-05 |
| 7958565 | Scan type probe microscope and cantilever drive device | Takayuki Uchihashi, Noriyuki Kodera, Hayato Yamashita | 2011-06-07 |
| 7954165 | Scanning probe microscope | Mitsuru Sakashita, Takayuki Uchihashi | 2011-05-31 |
| 7757518 | Sock | Kenji Sho, Shu Morioka, Takahiko Fukumoto, Hiroshi Maeoka | 2010-07-20 |
| 7677061 | Socks of multi-stage pile structure | Miyuki Mori, Takao Fukui, Makoto Ohata, Hideo Hirano | 2010-03-16 |
| 7556968 | Scanning probe microscope and molecular structure change observation method | Yoshiaki Hayashi | 2009-07-07 |
| 7259058 | Fabricating method of semiconductor integrated circuits | Yasuhiro Shimamoto, Masahiko Hiratani, Yuichi Matsui, Satoshi Yamamoto, Toshihide Nabatame +2 more | 2007-08-21 |
| 7059815 | Elastic fastener | Hiroyuki Masugata | 2006-06-13 |
| 6960363 | Treatment method for preservation of plant leaves | Yoshihiro Ueda, Tadashi Sekiyama | 2005-11-01 |
| 6812165 | Manufacturing method of semiconductor integrated circuit device | Hidenori Sato, Yoshiyuki Hayashi | 2004-11-02 |
| 6809306 | Scanning unit and scanning microscope having the same | Akitoshi Toda | 2004-10-26 |
| 6706647 | Method of and apparatus for manufacturing semiconductors | Yoshitsugu Tsutsumi, Yoshio Okamoto, Hideki Tomioka, Akira Ohkawa | 2004-03-16 |
| 6632750 | Manufacturing method of semiconductor integrated circuit device | Hidenori Sato, Yoshiyuki Hayashi | 2003-10-14 |
| 6617761 | Scanning unit and scanning microscope having the same | Akitoshi Toda | 2003-09-09 |
| 6395413 | Perpendicular magnetic recording medium | — | 2002-05-28 |
| 6365548 | Treatment method for preserving cut flowers | Takashi Kokubun, Tadashi Sekiyama | 2002-04-02 |
| 6194292 | Method of fabricating in-situ doped rough polycrystalline silicon using a single wafer reactor | Robert Tsu, Shintaro Aoyama | 2001-02-27 |
| 6118121 | Probe scanning mechanism for a scanning probe microscope | Yoshiaki Hayashi | 2000-09-12 |