MH

Masahiko Hiratani

HI Hitachi: 23 patents #1,433 of 28,497Top 6%
RT Renesas Technology: 14 patents #133 of 3,337Top 4%
RE Renesas Electronics: 2 patents #1,855 of 4,529Top 45%
📍 Kokubunji, JP: #33 of 714 inventorsTop 5%
Overall (All Time): #83,392 of 4,157,543Top 3%
39
Patents All Time

Issued Patents All Time

Showing 1–25 of 39 patents

Patent #TitleCo-InventorsDate
8106441 Semiconductor device having plural DRAM memory cells and a logic circuit and method for manufacturing the same Satoru Akiyama, Takao Watanabe, Yuichi Matsui 2012-01-31
7804118 Semiconductor device having plural DRAM memory cells and a logic circuit and method for manufacturing the same Satoru Akiyama, Takao Watanabe, Yuichi Matsui 2010-09-28
7800153 Capacitive electrode having semiconductor layers with an interface of separated grain boundaries Yuichi Matsui 2010-09-21
7683419 Semiconductor device having plural DRAM memory cells and a logic circuit and method for manufacturing the same Satoru Akiyama, Takao Watanabe, Yuichi Matsui 2010-03-23
7511327 Capacitive electrode having semiconductor layers with an interface of separated grain boundaries Yuichi Matsui 2009-03-31
7408218 Semiconductor device having plural dram memory cells and a logic circuit Satoru Akiyama, Takao Watanabe, Yuichi Matsui 2008-08-05
7265407 Capacitive electrode having semiconductor layers with an interface of separated grain boundaries Yuichi Matsui 2007-09-04
7259058 Fabricating method of semiconductor integrated circuits Yasuhiro Shimamoto, Yuichi Matsui, Satoshi Yamamoto, Toshihide Nabatame, Toshio Ando +2 more 2007-08-21
7119407 Semiconductor device and manufacturing method thereof Yasuhiro Shimamoto, Katsunori Obata, Kazuyoshi Torii 2006-10-10
6992022 Fabrication method for semiconductor integrated devices Yasuhiro Shimamoto, Yuichi Matsui, Toshihide Nabatame 2006-01-31
6989304 Method for manufacturing a ruthenium film for a semiconductor device Yuichi Matsui, Yasuhiro Shimamoto, Toshihide Nabatame 2006-01-24
6955959 Method of making a memory structure having a multilayered contact and a storage capacitor with a composite dielectric layer of crystalized niobium pentoxide and tantalum pentoxide films Yuichi Matsui 2005-10-18
6867090 Semiconductor device and method of manufacturing thereof Shinichiro Kimura, Tomoyuki Hamada 2005-03-15
6833577 Semiconductor device Yuichi Matsui 2004-12-21
6787451 Semiconductor device and manufacturing method thereof Yasuhiro Shimamoto, Katsunori Obata, Kazuyoshi Torii 2004-09-07
6743739 Fabrication method for semiconductor integrated devices Yasuhiro Shimamoto, Yuichi Matsui, Toshihide Nabatame 2004-06-01
6740901 Production of semiconductor integrated circuit Hiroshi Miki, Yasuhiro Shimamoto, Tomoyuki Hamada 2004-05-25
6720603 CAPACITOR STRUCTURE AND A SEMICONDUCTOR DEVICE WITH A FIRST METAL LAYER, A SECOND METAL SILICIDE LAYER FORMED OVER THE FIRST METAL LAYER AND A SECOND METAL LAYER FORMED OVER THE SECOND METAL SILICIDE LAYER Shinpei Iijima, Yuzuru Ohji, Masato Kunitomo, Yuichi Matsui, Hiroyuki Ohta +1 more 2004-04-13
6713343 Method of forming a semiconductor device with a capacitor including a polycrystalline tantalum oxide film dielectric Yasuhiro Sugawara, Shinpei Iijima, Yuzuru Oji, Naruhiko Nakanishi, Misuzu Kanai 2004-03-30
6693792 Semiconductor integrated circuits and fabricating method thereof Yasuhiro Shimamoto, Hiroshi Miki 2004-02-17
6664157 Semiconductor integrated circuit device and the method of producing the same Shinpei Iijima, Yoshitaka Nakamura, Yuichi Matsui, Naruhiko Nakanishi 2003-12-16
6583023 Method for making semiconductor integrated circuits Yasuhiro Shimamoto, Hiroshi Miki 2003-06-24
6576928 Semiconductor device capacitor with high permittivity tantalum pentoxide/niobium pentoxide dielectric Shinichiro Kimura, Tomoyuki Hamada 2003-06-10
6555429 Method of manufacturing semiconductor devices utilizing underlayer-dependency of deposition of capacitor electrode film, and semiconductor device Yuichi Matsui, Yasuhiro Shimamoto, Yoshitaka Nakamura, Toshihide Nabatame 2003-04-29
6544834 Method of forming a semiconductor device including a capacitor with tantalum oxide (Ta2O5) Yasuhiro Sugawara, Shinpei Iijima, Yuzuru Oji, Naruhiko Nakanishi, Misuzu Kanai 2003-04-08