Issued Patents All Time
Showing 1–25 of 42 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7010966 | SPM cantilever and fabricating method thereof | Masashi Kitazawa, Koichi Shiotani | 2006-03-14 |
| 6809306 | Scanning unit and scanning microscope having the same | Toshio Ando | 2004-10-26 |
| 6694805 | Cantilever for scanning probe microscopy | Koichi Shiotani, Masashi Kitazawa, Kenji Sato | 2004-02-24 |
| 6617761 | Scanning unit and scanning microscope having the same | Toshio Ando | 2003-09-09 |
| 6246054 | Scanning probe microscope suitable for observing the sidewalls of steps in a specimen and measuring the tilt angle of the sidewalls | Shuzo Mishima | 2001-06-12 |
| 5859364 | Scanning probe microscope | Takeshi Konada | 1999-01-12 |
| 5835251 | Scanner system | Shuichi Ito, Hirofumi Miyamoto, Akira Yagi | 1998-11-10 |
| 5675145 | Scanning probe microscope having an optical system for enabling identification of the scanning region and sample observation during a scanning operation | Takeshi Konada | 1997-10-07 |
| 5526165 | Scanner system | Shuichi Ito, Hirofumi Miyamoto, Akira Yagi | 1996-06-11 |
| 5386720 | Integrated AFM sensor | Michio Takayama, Katsuhiro Matsuyama, Nobuaki Sakai, Yasushi Nakamura | 1995-02-07 |
| 5386110 | Method of making cantilever chip for scanning probe microscope | — | 1995-01-31 |
| 5367165 | Cantilever chip for scanning probe microscope | Katsuhiro Matsuyama | 1994-11-22 |
| 5319961 | Cantilever chip for use in scanning probe microscope | Katsuhiro Matsuyama | 1994-06-14 |
| 5294790 | Probe unit for near-field optical scanning microscope | Yoshinori Ohta, Hiroshi Kajimura, Tsugiko Takase | 1994-03-15 |
| 5289408 | Memory apparatus using tunnel current techniques | Yoshiyuki Mimura, Hiroshi Kajimura, Toshihito Kouchi, Yasuo Isono, Hiroko Ohta +1 more | 1994-02-22 |
| 5272913 | Cantilever for a scanning probe microscope and a method of manufacturing the same | Kaoru Tadokoro, Yasuji Nagata, Etsuo Shinohara, Yoshimitsu Enomoto, Michio Takayama +1 more | 1993-12-28 |
| 5264696 | Cantilever chip for scanning probe microscope having first and second probes formed with different aspect ratios | — | 1993-11-23 |
| 5253515 | Atomic probe microscope and cantilever unit for use in the microscope | Shuzo Mishima | 1993-10-19 |
| 5247186 | Integrated optical displacement sensor | — | 1993-09-21 |
| 5216254 | Circuit pattern forming apparatus using MU-STM | Hiroko Ohta, Ryouhei Shimizu, Toshihito Kouchi, Yasuo Isono, Yoshiyuki Mimura +1 more | 1993-06-01 |
| 5150234 | Imaging apparatus having electrooptic devices comprising a variable focal length lens | Susumu Takahashi, Akira Takano, Hirofumi Miyanaga, Hisanari Shimazu, Kimihiko Nishioka +2 more | 1992-09-22 |
| 5144581 | Apparatus including atomic probes utilizing tunnel current to read, write and erase data | Ryouhei Shimizu, Hiroko Ohta, Hiroshi Kajimura, Yoshiyuki Mimura, Yasuo Isono +1 more | 1992-09-01 |
| 5136162 | Measuring device in a scanning probe microscope | Hirofumi Miyamoto, Tsugiko Takase, Hiroshi Kajimura | 1992-08-04 |
| 5097352 | Optical system including liquid crystal devices | Susumu Takahashi, Yoshinao Oaki, Akira Takano, Hirofumi Miyanaga, Hisanari Shimazu +2 more | 1992-03-17 |
| 5091880 | Memory device | Yasuo Isono, Toshihito Kouchi, Hiroshi Kajimura, Yoshiyuki Mimura, Hiroko Ohta +1 more | 1992-02-25 |