Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6127681 | Scanning tunnel microscope | Chiaki Sato, Kiyozo Koshiishi, Sadao Shigetomi, Shuzo Mishima | 2000-10-03 |
| 5296704 | Scanning tunneling microscope | Shuzo Mishima, Takao Okada, Hiroko Ota, Hirofumi Miyamoto | 1994-03-22 |
| 5294790 | Probe unit for near-field optical scanning microscope | Yoshinori Ohta, Hiroshi Kajimura, Akitoshi Toda | 1994-03-15 |
| 5289004 | Scanning probe microscope having cantilever and detecting sample characteristics by means of reflected sample examination light | Takao Okada, Akira Yagi, Yasuhiro Sugawara, Seizo Morita | 1994-02-22 |
| 5260824 | Atomic force microscope | Takao Okada, Shuzo Mishima, Hirofumi Miyamoto, Hiroko Ohta, Yasushi Satoh +4 more | 1993-11-09 |
| D335888 | Probe for a scanning tunneling microscope | Takao Okada, Shuzo Mishima, Hisanari Shimazu, Akira Yagi, Hiroko Ota +2 more | 1993-05-25 |
| 5138159 | Scanning tunneling microscope | Takao Okada | 1992-08-11 |
| 5136162 | Measuring device in a scanning probe microscope | Hirofumi Miyamoto, Hiroshi Kajimura, Akitoshi Toda | 1992-08-04 |
| 5083022 | Scanning tunneling microscope | Hirofumi Miyamoto, Takao Okada, Shuzo Mishima, Hiroko Ohta | 1992-01-21 |
| 5059793 | Scanning tunneling microscope having proper servo control function | Hirofumi Miyamoto, Takao Okada, Shuzo Mishima, Hiroko Ota | 1991-10-22 |
| 5041783 | Probe unit for an atomic probe microscope | Hiroko Ohta, Shuzo Mishima, Hirofumi Miyamoto, Takao Okada | 1991-08-20 |
| 4987303 | Micro-displacement detector device, piezo-actuator provided with the micro-displacement detector device and scanning probe microscope provided with the piezo-actuator | Hideo Adachi, Takao Okada, Hisanari Shimazu, Hideo Tomabechi | 1991-01-22 |