Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6060781 | Semiconductor device | Kouetsu Sawai | 2000-05-09 |
| 6016278 | Failure analysis method and device | Masaaki Furuta | 2000-01-18 |
| 6009545 | System for analyzing a failure in a semiconductor wafer by calculating correlation coefficient between collated data of defects per prescribed unit and failures per prescribed unit | Tohru Koyama, Fumihito Ohta, Yasukazu Mukogawa, Masaaki Furuta, Yohji Mashiko | 1999-12-28 |
| 5905650 | Failure analyzer | Masaaki Furuta | 1999-05-18 |
| 5844850 | Apparatus for analyzing a failure in a semiconductor wafer and method thereof | Tohru Koyama, Fumihito Ohta, Yasukazu Mukogawa, Masaaki Furuta, Yohji Mashiko | 1998-12-01 |