Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6819788 | Failure analysis method that allows high-precision failure mode classification | — | 2004-11-16 |
| 6108253 | Failure analysis system, fatal failure extraction method and recording medium | — | 2000-08-22 |
| 6009545 | System for analyzing a failure in a semiconductor wafer by calculating correlation coefficient between collated data of defects per prescribed unit and failures per prescribed unit | Toshikazu Tsutsui, Tohru Koyama, Yasukazu Mukogawa, Masaaki Furuta, Yohji Mashiko | 1999-12-28 |
| 5844850 | Apparatus for analyzing a failure in a semiconductor wafer and method thereof | Toshikazu Tsutsui, Tohru Koyama, Yasukazu Mukogawa, Masaaki Furuta, Yohji Mashiko | 1998-12-01 |