Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6016278 | Failure analysis method and device | Toshikazu Tsutsui | 2000-01-18 |
| 6009545 | System for analyzing a failure in a semiconductor wafer by calculating correlation coefficient between collated data of defects per prescribed unit and failures per prescribed unit | Toshikazu Tsutsui, Tohru Koyama, Fumihito Ohta, Yasukazu Mukogawa, Yohji Mashiko | 1999-12-28 |
| 5905650 | Failure analyzer | Toshikazu Tsutsui | 1999-05-18 |
| 5844850 | Apparatus for analyzing a failure in a semiconductor wafer and method thereof | Toshikazu Tsutsui, Tohru Koyama, Fumihito Ohta, Yasukazu Mukogawa, Yohji Mashiko | 1998-12-01 |