Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6009545 | System for analyzing a failure in a semiconductor wafer by calculating correlation coefficient between collated data of defects per prescribed unit and failures per prescribed unit | Toshikazu Tsutsui, Tohru Koyama, Fumihito Ohta, Yasukazu Mukogawa, Masaaki Furuta | 1999-12-28 |
| 5844850 | Apparatus for analyzing a failure in a semiconductor wafer and method thereof | Toshikazu Tsutsui, Tohru Koyama, Fumihito Ohta, Yasukazu Mukogawa, Masaaki Furuta | 1998-12-01 |