TK

Tohru Koyama

HI Hitachi: 12 patents #3,472 of 28,497Top 15%
Mitsubishi Electric: 9 patents #3,275 of 25,717Top 15%
RT Renesas Technology: 4 patents #758 of 3,337Top 25%
HC Hitachi Chemical Company: 2 patents #701 of 1,946Top 40%
RE Ryoden Semiconductor System Engineering: 2 patents #57 of 195Top 30%
Overall (All Time): #139,828 of 4,157,543Top 4%
28
Patents All Time

Issued Patents All Time

Showing 1–25 of 28 patents

Patent #TitleCo-InventorsDate
7659028 Polymer electrolyte fuel cell Katsunori Nishimura, Masahiro Komachiya, Jinichi Imahashi, Tomoichi Kamo 2010-02-09
7541107 Solid polyelectrolyte, assembly of membrane and electrodes, amd fuel cell Toshiyuki Kobayashi, Kenji Yamaga, Tomoichi Kamo, Kazutoshi Higashiyama 2009-06-02
7425383 Electrode for polymer electrolyte fuel cell, separator therefore, and polymer electrolyte fuel cell, and generating system using them Katsunori Nishimura, Masahiro Komachiya, Jinichi Imahashi, Tomoichi Kamo 2008-09-16
7279244 Fuel cell, polyelectrolyte and ion-exchange resin use for same Makoto Morishima, Tomoichi Kamo, Toshiyuki Kobayashi, Kenji Yamaga 2007-10-09
7022743 Fuel cell, polyelectrolyte and ion-exchange resin used for same Makoto Morishima, Tomoichi Kamo, Toshiyuki Kobayashi, Kenji Yamaga 2006-04-04
6989212 Fuel cell, polyelectrolyte and ion-exchange resin used for same Makoto Morishima, Tomoichi Kamo, Toshiyuki Kobayashi, Kenji Yamaga 2006-01-24
6893764 Solid polyelectrolyte, assembly of membrane and electrodes, and fuel cell Toshiyuki Kobayashi, Kenji Yamaga, Tomoichi Kamo, Kazutoshi Higashiyama 2005-05-17
6838340 Method of manufacturing semiconductor device having MIM capacitor element Tomohiro Tanaka, Naofumi Murata 2005-01-04
6745618 Scanning probe microscope Yukari Imai, Mari Tsugami, Hitoshi Maeda 2004-06-08
6677760 Method of and apparatus for analyzing failure 2004-01-13
6678623 Failure analysis device and failure analysis method 2004-01-13
6614049 System LSI chip having a logic part and a memory part 2003-09-02
6009545 System for analyzing a failure in a semiconductor wafer by calculating correlation coefficient between collated data of defects per prescribed unit and failures per prescribed unit Toshikazu Tsutsui, Fumihito Ohta, Yasukazu Mukogawa, Masaaki Furuta, Yohji Mashiko 1999-12-28
5982056 Thermosetting resin composition, electrically insulated coil, electric rotating machine and method for producing same Katsuo Sugawara, Shoichi Maruyama, Ikushi Kano, Yoshikiyo Kashiwamura 1999-11-09
5952837 Scanning photoinduced current analyzer capable of detecting photoinduced current in nonbiased specimen 1999-09-14
5844850 Apparatus for analyzing a failure in a semiconductor wafer and method thereof Toshikazu Tsutsui, Fumihito Ohta, Yasukazu Mukogawa, Masaaki Furuta, Yohji Mashiko 1998-12-01
5760892 Method of analyzing failure of semiconductor device by using emission microscope and system for analyzing failure of semiconductor device 1998-06-02
5733402 Method for producing electrically insulated coils Katsuo Sugawara, Syoichi Maruyama 1998-03-31
5708371 Scanning photoinduced current analyzer capable of detecting photoinduced current in nonbiased specimen 1998-01-13
5381032 Semiconductor device having a gate electrode of polycrystal layer and a method of manufacturing thereof Yoshiko Kokawa, Kenji Kusakabe, Katsuhiko Tamura, Yasuna Nakamura 1995-01-10
5324767 Thermosetting resin composition for casting high-voltage coil, and molded coil and panel formed by casting and curing the composition Hirokazu Takasaki, Hiroshi Suzuki, Shigeo Amagi, Akio Mukoh, Ikushi Kano 1994-06-28
5221630 Method of manufacturing semiconductor device having a two layered structure gate electrode Katsuhiko Tamura, Yasuna Nakamura, Yoshiko Kokawa, Kenji Kusakabe 1993-06-22
5177569 Semiconductor device having a two layered structure gate electrode Katsuhiko Tamura, Yasuna Nakamura, Yoshiko Kokawa, Kenji Kusakabe 1993-01-05
5166283 Polymer having dihydropyridine rings or dihydrotriazine rings, process for producing the same, and applications thereof Akio Nishikawa, Hideki Asano, Toshikazu Narahara 1992-11-24
5075159 Electrically insulated coil Chikashi Kanno, Koo Honjyo, Noriyuki Kinjo, Ikushi Kano, Syoichi Maruyama 1991-12-24