Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8344511 | Method for manufacturing a semiconductor device having a silicide region comprised of a silicide of a nickel alloy | Kazuhito Ichinose | 2013-01-01 |
| 8158473 | Method for manufacturing a semiconductor device having a silicide region comprised of a silicide of a nickel alloy | Kazuhito Ichinose | 2012-04-17 |
| 6745618 | Scanning probe microscope | Mari Tsugami, Hitoshi Maeda, Tohru Koyama | 2004-06-08 |
| 6545470 | Scanning probe microscope | Hitoshi Maeda, Mari Tsugami, Yoji Mashiko | 2003-04-08 |
| 5850149 | Evaluation method for semiconductor devices | Toshiharu Katayama, Naoko Ohtani | 1998-12-15 |
| 5677204 | Method of evaluating a thin film for use in semiconductor device | Toshiharu Katayama, Naoko Otani | 1997-10-14 |
| 5633184 | Method of making semiconductor device with floating bate | Katsuhiko Tamura, Naoko Otani | 1997-05-27 |
| 5434813 | Semiconductor memory device and manufacturing method of the same | Katsuhiko Tamura, Naoko Otani | 1995-07-18 |