Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7023541 | Device inspecting for defect on semiconductor wafer surface | Mariko Mizuo | 2006-04-04 |
| 6650129 | Method of testing semiconductor device | — | 2003-11-18 |
| 6636824 | Method of and apparatus for inspecting semiconductor device | Kouetsu Sawai, Masahiko Ikeno | 2003-10-21 |
| 6233956 | Expansion valve | Kazuhiko Watanabe | 2001-05-22 |
| 5850149 | Evaluation method for semiconductor devices | Naoko Ohtani, Yukari Imai | 1998-12-15 |
| 5786612 | Semiconductor device comprising trench EEPROM | Naoko Otani | 1998-07-28 |
| 5708285 | Non-volatile semiconductor information storage device | Naoko Otani | 1998-01-13 |
| 5705027 | Method of removing etching residues | Naoko Ootani | 1998-01-06 |
| 5677204 | Method of evaluating a thin film for use in semiconductor device | Yukari Imai, Naoko Otani | 1997-10-14 |
| 5444278 | Semiconductor device and manufacturing method thereof | — | 1995-08-22 |
| 5243219 | Semiconductor device having impurity diffusion region formed in substrate beneath interlayer contact hole | — | 1993-09-07 |
| 5047831 | Reduced resistance contact region for semiconductor device | — | 1991-09-10 |