Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7023541 | Device inspecting for defect on semiconductor wafer surface | Toshiharu Katayama | 2006-04-04 |
| 6528334 | Semiconductor inspection system, and method of manufacturing a semiconductor device | Yoko Miyazaki | 2003-03-04 |