Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6636824 | Method of and apparatus for inspecting semiconductor device | Masahiko Ikeno, Toshiharu Katayama | 2003-10-21 |
| 6060781 | Semiconductor device | Toshikazu Tsutsui | 2000-05-09 |