Patent Leaderboard
USPTO Patent Rankings Data through Sept 30, 2025
ZS

Zhenlei Shen

Micron: 71 patents #222 of 6,345Top 4%
STSandisk Technologies: 5 patents #524 of 2,224Top 25%
Milpitas, CA: #22 of 3,192 inventorsTop 1%
California: #3,738 of 386,348 inventorsTop 1%
Overall (All Time): #24,777 of 4,157,543Top 1%
76 Patents All Time

Issued Patents All Time

Showing 1–25 of 76 patents

Patent #TitleCo-InventorsDate
12373111 Monitoring memory device health according to data storage metrics Tingjun Xie, Seungjune Jeon, Zhenming Zhou 2025-07-29
12272418 Performing select gate integrity checks to identify and invalidate defective blocks Zhongguang Xu, Murong Lang 2025-04-08
12260916 Partial block handling in a non-volatile memory device Zhongguang Xu, Nicola Ciocchini, Charles See Yeung Kwong, Murong Lang, Ugo Russo +1 more 2025-03-25
12183406 Eliminating write disturb for system metadata in a memory sub-system Tingjun Xie, Zhenming Zhou, Charles See Yeung Kwong 2024-12-31
12164779 Deck based media management operations in memory devices Zhenming Zhou, Seungjune Jeon 2024-12-10
12050808 Selecting a write operation mode from multiple write operation modes Fangfang Zhu, Tingjun Xie, Jiangli Zhu 2024-07-30
12045512 Read refresh via signal calibration for non-volatile memories Tingjun Xie, Zhenming Zhou, Chih-Kuo Kao 2024-07-23
11977480 Scaling factors for media management operations at a memory device Mikai Chen, Murong Lang, Zhenming Zhou 2024-05-07
11901014 Partial block handling in a non-volatile memory device Zhongguang Xu, Nicola Ciocchini, Charles See Yeung Kwong, Murong Lang, Ugo Russo +1 more 2024-02-13
11894090 Selective power-on scrub of memory units Tingjun Xie, Zhenming Zhou 2024-02-06
11870461 Failure-tolerant error correction layout for memory sub-systems Wei-Cheng Wu, Zhengang Chen 2024-01-09
11854644 Performing select gate integrity checks to identify and invalidate defective blocks Zhongguang Xu, Murong Lang 2023-12-26
11790998 Eliminating write disturb for system metadata in a memory sub-system Tingjun Xie, Zhenming Zhou, Charles See Yeung Kwong 2023-10-17
11775388 Defect detection in memory based on active monitoring of read operations Tingjun Xie, Frederick Adi, Wei Wang, Zhenming Zhou 2023-10-03
11776611 Managing write disturb for units of a memory device using weighted write disturb counts Mikai Chen, Zhenming Zhou, Murong Lang 2023-10-03
11763896 Preread and read threshold voltage optimization Seungjune Jeon, Zhenming Zhou 2023-09-19
11756597 Power-on read demarcation voltage optimization Mikai Chen, Murong Lang, Zhenming Zhou 2023-09-12
11756635 Decision for executing full-memory refresh during memory sub-system power-on stage Tingjun Xie, Zhenming Zhou 2023-09-12
11741008 Disassociating memory units with a host system Dhawal Bavishi 2023-08-29
11720273 Codeword error leveling for 3DXP memory devices Jian Huang, Zhenming Zhou 2023-08-08
11694017 Temperature-based on board placement of memory devices Tingjun Xie, Charles See Yeung Kwong 2023-07-04
11693736 Modifying conditions for memory device error corrections operations Tingjun Xie 2023-07-04
11688467 Defect detection in memories with time-varying bit error rate Zhengang Chen, Sai Krishna Mylavarapu, Tingjun Xie, Charles See Yeung Kwong 2023-06-27
11687248 Life time extension of memory device based on rating of individual memory units Zhongguang Xu, Tingjun Xie, Seungjune Jeon, Murong Lang, Zhenming Zhou 2023-06-27
11656938 Preemptive read verification after hardware write back Frederick Adi, Wei Wang 2023-05-23