TM

Todd A. Merritt

Micron: 173 patents #53 of 6,345Top 1%
RR Round Rock Research: 2 patents #110 of 239Top 50%
Microsoft: 1 patents #24,826 of 40,388Top 65%
📍 Boise, ID: #24 of 3,546 inventorsTop 1%
🗺 Idaho: #35 of 8,810 inventorsTop 1%
Overall (All Time): #4,331 of 4,157,543Top 1%
178
Patents All Time

Issued Patents All Time

Showing 76–100 of 178 patents

Patent #TitleCo-InventorsDate
6365421 Method and apparatus for storage of test results within an integrated circuit Brett Debenham, Kim Pierce, Douglas J. Cutter, Kurt D. Beigel, Fan Ho +6 more 2002-04-02
6363032 Programmable counter circuit for generating a sequential/interleave address sequence 2002-03-26
6356487 Memory device having data path containing dual mode flip-flop used for normal operation and for internal testing 2002-03-12
6353549 Architecture and package orientation for high speed memory devices 2002-03-05
6351421 Data output buffer 2002-02-26
6333882 Equilibration/pre-charge circuit for a memory device George B. Raad, Charles L. Ingalls 2001-12-25
6327167 Die architecture accommodating high-speed semiconductor devices Donald M. Morgan 2001-12-04
6320779 Die architecture accommodating high-speed semiconductor devices Donald M. Morgan 2001-11-20
6314012 Die architecture accommodating high-speed semiconductor devices Donald M. Morgan 2001-11-06
6307398 Low power, high speed level shifter Troy A. Manning 2001-10-23
6301141 Die architecture accommodating high-speed semiconductor devices Donald M. Morgan 2001-10-09
6301142 Die architecture accomodating high-speed semiconductor devices Donald M. Morgan 2001-10-09
6285243 High-voltage charge pump circuit Richard A. Mecier 2001-09-04
6259270 Semiconductor programmable test arrangement such as an antifuse ID circuit having common programming switches 2001-07-10
6243797 Multiplexed semiconductor data transfer arrangement with timing signal generator 2001-06-05
6215729 Programmable counter circuit for generating a sequential/interleave address sequence 2001-04-10
6205085 Method and circuit for sending a signal in a semiconductor device during a setup time Donald M. Morgan 2001-03-20
6205078 Method and apparatus for translating signals 2001-03-20
6197620 Method of manufacturing a single deposition layer metal dynamic random access memory 2001-03-06
6194738 Method and apparatus for storage of test results within an integrated circuit Brett Debenham, Kim Pierce, Douglas J. Cutter, Kurt D. Beigel, Fan Ho +6 more 2001-02-27
6190972 Method for storing information in a semiconductor device Hua Zheng, Michael A. Shore, Jeffrey P. Wright 2001-02-20
6191616 Low power, high speed level shifter Troy A. Manning 2001-02-20
6192002 Memory device with command buffer 2001-02-20
6188239 Semiconductor programmable test arrangement such as an antifuse to ID circuit having common access switches and/or common programming switches 2001-02-13
6185145 Method and apparatus for translating signals 2001-02-06