Issued Patents All Time
Showing 51–75 of 178 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6578165 | Internal guardband for semiconductor testing | — | 2003-06-10 |
| 6577552 | Apparatus and method for generating an oscillating signal | Hal Butler | 2003-06-10 |
| RE38109 | Block write circuit and method for wide data path memory device | Layne Bunker | 2003-05-06 |
| 6560728 | Layout for semiconductor memory device having a plurality of rows and columns of circuit cells divided into first and second planes that are not simultaneously active | — | 2003-05-06 |
| 6556643 | Majority filter counter circuit | — | 2003-04-29 |
| 6545894 | Die architecture accommodating high-speed semiconductor devices | Donald M. Morgan | 2003-04-08 |
| 6535999 | Test and observe mode for embedded memory | Nick van Heel | 2003-03-18 |
| 6529426 | Circuit and method for varying a period of an internal control signal during a test mode | Paul S. Zagar | 2003-03-04 |
| 6525971 | Distributed write data drivers for burst access memories | Troy A. Manning | 2003-02-25 |
| 6504421 | Voltage pump and a level translator circuit | Greg A. Blodgett | 2003-01-07 |
| 6504743 | Die architecture accommodating high-speed semiconductor devices | Donald M. Morgan | 2003-01-07 |
| 6501669 | Die architecture accommodating high-speed semiconductor devices | Donald M. Morgan | 2002-12-31 |
| 6498740 | Die architecture accommodating high-speed semiconductor devices | Donald M. Morgan | 2002-12-24 |
| 6490220 | Method for reliably shutting off oscillator pulses to a charge-pump | Shubneesh Batra | 2002-12-03 |
| 6484278 | Method and apparatus for testing an embedded DRAM | Donald M. Morgan, Huy T. Vo | 2002-11-19 |
| 6452845 | Apparatus for testing redundant elements in a packaged semiconductor memory device | — | 2002-09-17 |
| 6438011 | Die architecture accommodating high-speed semiconductor devices | Donald M. Morgan | 2002-08-20 |
| 6430075 | Die architecture accommodating high-speed semiconductor devices | Donald M. Morgan | 2002-08-06 |
| 6418547 | Internal guardband for semiconductor testing | — | 2002-07-09 |
| 6414902 | Use of setup time to send signal through die | Donald M. Morgan | 2002-07-02 |
| 6407939 | Single deposition layer metal dynamic random access memory | — | 2002-06-18 |
| 6384669 | High voltage charge pump circuit | Richard A. Mecier | 2002-05-07 |
| 6385709 | Multiplexed data transfer arrangement including a multi-phase signal generator for latency control | — | 2002-05-07 |
| 6381180 | Distributed write data drivers for burst access memories | Troy A. Manning | 2002-04-30 |
| 6378089 | Internal guardband for semiconductor testing | — | 2002-04-23 |