NS

Nishant Sinha

Micron: 110 patents #127 of 6,345Top 3%
TB The Boeing: 13 patents #704 of 15,756Top 5%
IBM: 9 patents #11,918 of 70,183Top 20%
NA Nec Laboratories America: 6 patents #69 of 412Top 20%
CS Capital One Services: 3 patents #963 of 2,893Top 35%
RR Round Rock Research: 2 patents #110 of 239Top 50%
Samsung: 1 patents #49,284 of 75,807Top 70%
AL Accenture Global Solutions Limited: 1 patents #1,203 of 3,138Top 40%
FL Fractal Analytics Private Limited: 1 patents #4 of 29Top 15%
Pitney Bowes: 1 patents #764 of 1,308Top 60%
IN Intel: 1 patents #18,218 of 30,777Top 60%
AL Accenture Global Services Limited: 1 patents #922 of 1,988Top 50%
📍 Kanchinakote, ID: #1 of 2 inventorsTop 50%
Overall (All Time): #6,272 of 4,157,543Top 1%
149
Patents All Time

Issued Patents All Time

Showing 126–149 of 149 patents

Patent #TitleCo-InventorsDate
7042010 Intermediate semiconductor device having activated oxide-based layer for electroless plating 2006-05-09
7005379 Semiconductor processing methods for forming electrical contacts Dinesh Chopra, Fred Fishburn 2006-02-28
6969301 Filling plugs through chemical mechanical polish 2005-11-29
6946392 Filling plugs through chemical mechanical polish 2005-09-20
6936536 Methods of forming conductive through-wafer vias 2005-08-30
6906418 Semiconductor component having encapsulated, bonded, interconnect contacts William M. Hiatt, Warren M. Farnworth, Charles M. Watkins 2005-06-14
6900128 Activation of oxides for electroless plating 2005-05-31
6884723 Methods for planarization of group VIII metal-containing surfaces using complexing agents Rita J. Klein 2005-04-26
6872659 Activation of oxides for electroless plating 2005-03-29
6861309 Methods of forming spaced conductive regions, and methods of forming capacitor constructions Theodore M. Taylor 2005-03-01
6852627 Conductive through wafer vias Warren M. Farnworth 2005-02-08
6830500 Slurry for use with fixed-abrasive polishing pads in polishing semiconductor device conductive structures that include copper and tungsten and polishing methods Dinesh Chopra 2004-12-14
6803303 Method of fabricating semiconductor component having encapsulated, bonded, interconnect contacts William M. Hiatt, Warren M. Farnworth, Charles M. Watkins 2004-10-12
6787450 High aspect ratio fill method and resulting structure Paul A. Morgan 2004-09-07
6757971 Filling plugs through chemical mechanical polish 2004-07-06
6759751 Constructions comprising solder bumps 2004-07-06
6756682 High aspect ratio fill method and resulting structure Paul A. Morgan 2004-06-29
6710442 Microelectronic devices with improved heat dissipation and methods for cooling microelectronic devices Joseph T. Lindgren, Warren M. Farnworth, William M. Hiatt 2004-03-23
6706632 Methods for forming capacitor structures; and methods for removal of organic materials 2004-03-16
6703272 Methods of forming spaced conductive regions, and methods of forming capacitor constructions Theodore M. Taylor 2004-03-09
6602117 Slurry for use with fixed-abrasive polishing pads in polishing semiconductor device conductive structures that include copper and tungsten and polishing methods Dinesh Chopra 2003-08-05
6586043 Methods of electroless deposition of nickel, methods of forming under bump metallurgy, and constructions comprising solder bumps 2003-07-01
6551935 Slurry for use in polishing semiconductor device conductive structures that include copper and tungsten and polishing methods Dinesh Chopra 2003-04-22
6511906 Selective CMP scheme 2003-01-28