JP

John D. Porter

Micron: 128 patents #101 of 6,345Top 2%
CT Candescent Technologies: 24 patents #4 of 125Top 4%
CS Candescent Intellectual Property Services: 10 patents #5 of 83Top 7%
Motorola: 6 patents #1,752 of 12,470Top 15%
AW Axxcelera Broadband Wireless: 5 patents #1 of 3Top 35%
CL Cambridge Broadband Networks Group Limited: 4 patents #1 of 5Top 20%
SO Sony: 4 patents #8,966 of 25,231Top 40%
AM AMD: 3 patents #3,141 of 9,279Top 35%
HP HP: 2 patents #2,312 of 7,018Top 35%
TI Texas Instruments: 2 patents #5,248 of 12,488Top 45%
University of California: 1 patents #8,022 of 18,278Top 45%
RE Reflectivity: 1 patents #19 of 27Top 75%
Canon: 1 patents #14,899 of 19,416Top 80%
📍 Boise, ID: #21 of 3,546 inventorsTop 1%
🗺 Idaho: #32 of 8,810 inventorsTop 1%
Overall (All Time): #3,936 of 4,157,543Top 1%
186
Patents All Time

Issued Patents All Time

Showing 176–186 of 186 patents

Patent #TitleCo-InventorsDate
6005797 Latch-up prevention for memory cells William N. Thompson 1999-12-21
5863233 Field emitter fabrication using open circuit electrochemical lift off Gabriela S. Chakarova, N. Johan Knall, Christopher J. Spindt 1999-01-26
5811987 Block clock and initialization circuit for a complex high density PLD Benjamin H. Ashmore, Jr., Jeffery Mark Marshall, Bryon Irwin Moyer, Nicholas A. Schmitz, Bradley A. Sharpe-Geisler 1998-09-22
5717342 Output buffer incorporating shared intermediate nodes Younes Lotfi 1998-02-10
5687178 Method and apparatus for testing a static RAM Lawrence N. Herr, Mary Ann Coones 1997-11-11
5565794 Voltage range tolerant CMOS output buffer with reduced input capacitance 1996-10-15
5343428 Memory having a latching BICMOS sense amplifier Harold Pilo 1994-08-30
5291455 Memory having distributed reference and bias voltages Taisheng Feng, Jennifer Chiao 1994-03-01
5268866 Memory with column redundancy and localized column redundancy control signals Tiasheng Feng, Stephen T. Flannagan 1993-12-07
5256917 ECL logic gate with voltage protection Stephen T. Flannagan 1993-10-26
5003513 Latching input buffer for an ATD memory Brian D. Branson 1991-03-26