CI

Charles L. Ingalls

Micron: 125 patents #104 of 6,345Top 2%
NT Nanya Technology: 1 patents #447 of 775Top 60%
📍 Meridian, ID: #8 of 654 inventorsTop 2%
🗺 Idaho: #70 of 8,810 inventorsTop 1%
Overall (All Time): #8,976 of 4,157,543Top 1%
126
Patents All Time

Issued Patents All Time

Showing 101–125 of 126 patents

Patent #TitleCo-InventorsDate
6536004 On-chip circuit and method for testing memory devices Kim Pierce 2003-03-18
6429449 Three-dimensional container diode for use with multi-state material in a non-volatile memory cell Fernando Gonzalez, Raymond A. Turi, Graham R. Wolstenholme 2002-08-06
6411553 Single ended data bus equilibration scheme Jeffrey P. Wright, Victor Wong 2002-06-25
6345006 Memory circuit with local isolation and pre-charge circuits Huy T. Vo 2002-02-05
6345013 Latched row or column select enable driver Huy T. Vo 2002-02-05
6333882 Equilibration/pre-charge circuit for a memory device Todd A. Merritt, George B. Raad 2001-12-25
6275443 Latched row or column select enable driver Huy T. Vo 2001-08-14
6246623 Method and apparatus for strobing antifuse circuits in a memory device 2001-06-12
6178532 On-chip circuit and method for testing memory devices Kim Pierce 2001-01-23
6178501 Method and apparatus for initializing a memory device 2001-01-23
6118135 Three-dimensional container diode for use with multi-state material in a non-volatile memory cell Fernando Gonzalez, Raymond A. Turi, Graham R. Wolstenholme 2000-09-12
6064617 Method and apparatus for strobing antifuse circuits in a memory device 2000-05-16
5985698 Fabrication of three dimensional container diode for use with multi-state material in a non-volatile memory cell Fernando Gonzalez, Raymond A. Turi, Graham R. Wolstenholme 1999-11-16
5978285 Voltage-dependent delay 1999-11-02
5978297 Method and apparatus for strobing antifuse circuits in a memory device 1999-11-02
5964896 Method and apparatus for a high speed cyclical redundancy check system Mark R. Thomann, Huy T. Vo 1999-10-12
5936901 Shared data lines for memory write and memory test operations Victor Wong, Jeffrey P. Wright, Timothy B. Cowles 1999-08-10
5892716 Method and apparatus for global testing the impedance of a programmable element 1999-04-06
5854800 Method and apparatus for a high speed cyclical redundancy check system Mark R. Thomann, Huy T. Vo 1998-12-29
5831276 Three-dimensional container diode for use with multi-state material in a non-volatile memory cell Fernando Gonzalez, Raymond A. Turi, Graham R. Wolstenholme 1998-11-03
5805931 Programmable bandwidth I/O port and a communication interface using the same port having a plurality of serial access memories capable of being configured for a variety of protocols Christopher K. Morzano 1998-09-08
5648974 System having multiple subsystems and test signal source resident upon common substrate Mark R. Thomann 1997-07-15
5617367 Controlling synchronous serial access to a multiport memory Stephen D. Holland 1997-04-01
5524098 Controlling synchronous serial access to a multiport memory Stephen D. Holland 1996-06-04
5499250 System having multiple subsystems and test signal source resident upon common substrate Mark R. Thomann 1996-03-12