Issued Patents All Time
Showing 26–45 of 45 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9110138 | Fault dictionary based scan chain failure diagnosis | Ruifeng Guo, Wu-Tung Cheng | 2015-08-18 |
| 9086459 | Detection and diagnosis of scan cell internal defects | Ruifeng Guo, Liyang Lai, Wu-Tung Cheng | 2015-07-21 |
| 9057762 | Faulty chains identification without masking chain patterns | Wu-Tung Cheng, Ruifeng Guo, Manish Sharma | 2015-06-16 |
| 9015543 | Diagnosis-aware scan chain stitching | Wu-Tung Cheng, Ruifeng Guo, Liyang Lai | 2015-04-21 |
| 8935582 | Generating test sets for diagnosing scan chain failures | Ruifeng Guo, Wu-Tung Cheng | 2015-01-13 |
| 8862956 | Compound hold-time fault diagnosis | Wu-Tung Cheng, Ting-Pu Tai, Liyang Lai, Ruifeng Guo | 2014-10-14 |
| 8843796 | Profiling-based scan chain diagnosis | Wu-Tung Cheng | 2014-09-23 |
| 8689070 | Method and system for scan chain diagnosis | Wu-Tung Cheng, Ruifeng Guo, Ting-Pu Tai | 2014-04-01 |
| 8661304 | Test pattern generation for diagnosing scan chain failures | Ruifeng Guo, Wu-Tung Cheng | 2014-02-25 |
| 8615695 | Fault dictionary-based scan chain failure diagnosis | Ruifeng Guo, Wu-Tung Cheng | 2013-12-24 |
| 8595574 | Enhanced diagnosis with limited failure cycles | Wu-Tung Cheng, Nagesh Tamarapalli, Janusz Rajski, Randy Klingenberg | 2013-11-26 |
| 8438438 | Enhanced diagnosis with limited failure cycles | Wu-Tung Cheng, Nagesh Tamarapalli, Randy Klingenberg, Janusz Rajski | 2013-05-07 |
| 8316265 | Test pattern generation for diagnosing scan chain failures | Ruifeng Guo, Wu-Tung Cheng | 2012-11-20 |
| 8301414 | Compactor independent fault diagnosis | Wu-Tung Cheng, Kun-Han Tsai, Nagesh Tamarapalli, Janusz Rajski | 2012-10-30 |
| 8280688 | Compactor independent direct diagnosis of test hardware | Wu-Tung Cheng, Janusz Rajski | 2012-10-02 |
| 8261142 | Generating test sets for diagnosing scan chain failures | Ruifeng Guo, Wu-Tung Cheng | 2012-09-04 |
| 7840862 | Enhanced diagnosis with limited failure cycles | Wu-Tung Cheng, Nagesh Tamarapalli, Randy Klingenberg, Janusz Rajski | 2010-11-23 |
| 7788561 | Diagnosing mixed scan chain and system logic defects | Wu-Tung Cheng, Ruifeng Guo | 2010-08-31 |
| 7729884 | Compactor independent direct diagnosis of test hardware | Wu-Tung Cheng, Janusz Rajski | 2010-06-01 |
| 7239978 | Compactor independent fault diagnosis | Wu-Tung Cheng, Kun-Han Tsai, Nagesh Tamarapalli, Janusz Rajski | 2007-07-03 |