CL

Chuen-Jye Lin

ME Megica: 10 patents #9 of 32Top 30%
TSMC: 3 patents #5,465 of 12,232Top 45%
QU Qualcomm: 2 patents #5,578 of 12,104Top 50%
VS Vanguard International Semiconductor: 1 patents #340 of 585Top 60%
Overall (All Time): #298,288 of 4,157,543Top 8%
16
Patents All Time

Issued Patents All Time

Showing 1–16 of 16 patents

Patent #TitleCo-InventorsDate
9369175 Low fabrication cost, high performance, high reliability chip scale package Jin-Yuan Lee, Ming-Ta Lei, Ching-Cheng Huang 2016-06-14
8901733 Reliable metal bumps on top of I/O pads after removal of test probe marks Ching-Cheng Huang, Ming-Ta Lei, Mou-Shiung Lin 2014-12-02
8685834 Fabrication method of package structure with simplified encapsulation structure and simplified wiring Pei-Haw Tsao, Chender Huang 2014-04-01
8481418 Low fabrication cost, high performance, high reliability chip scale package Jin-Yuan Lee, Ming-Ta Lei, Ching-Cheng Huang 2013-07-09
8178967 Low fabrication cost, high performance, high reliability chip scale package Jin-Yuan Lee, Ming-Ta Lei, Ching-Cheng Huang 2012-05-15
8158508 Structure and manufacturing method of a chip scale package Mou-Shiung Lin, Ming-Ta Lei 2012-04-17
7902679 Structure and manufacturing method of a chip scale package with low fabrication cost, fine pitch and high reliability solder bump Mou-Shiung Lin, Ming-Ta Lei 2011-03-08
7638887 Package structure and fabrication method thereof Pei-Haw Tsao, Chender Huang 2009-12-29
7465653 Reliable metal bumps on top of I/O pads after removal of test probe marks Ching-Cheng Huang, Ming-Ta Lei, Mou-Shiung Lin 2008-12-16
7355288 Low fabrication cost, high performance, high reliability chip scale package Jin-Yuan Lee, Ming-Ta Lei, Ching-Cheng Huang 2008-04-08
7338890 Low fabrication cost, high performance, high reliability chip scale package Jin-Yuan Lee, Ming-Ta Lei, Ching-Cheng Huang 2008-03-04
7105920 Substrate design to improve chip package reliability Chao-Yuan Su, Chen-Der Huang, Pei-Haw Tsao 2006-09-12
6917119 Low fabrication cost, high performance, high reliability chip scale package Jin-Yuan Lee, Ming-Ta Lei, Ching-Cheng Huang 2005-07-12
6815324 Reliable metal bumps on top of I/O pads after removal of test probe marks Ching-Cheng Huang, Ming-Ta Lei, Mou-Shiung Lin 2004-11-09
6642136 Method of making a low fabrication cost, high performance, high reliability chip scale package Jin-Yuan Lee, Ming-Ta Lei, Ching-Cheng Huang 2003-11-04
6075281 Modified lead finger for wire bonding Kuang-Ho Liao, Tsung-Chieh Chen 2000-06-13