| 10892265 |
Word line structure and method of manufacturing the same |
Chi-Min Chen, Yung-Tai Hung, Ta-Hung Yang, Kuang-Chao Chen |
2021-01-12 |
|
| 10497652 |
Semiconductor substrate and semiconductor device |
Ling Yang, Ta-Hung Yang, Kuang-Chao Chen |
2019-12-03 |
|
| 10388664 |
Integrated circuit device with layered trench conductors |
Yukai Huang, Chun-Ling Chiang, Yung-Tai Hung, Chun-Min Cheng, Ling Yang +2 more |
2019-08-20 |
|
| 9869712 |
Method and system for detecting defects of wafer by wafer sort |
I-Jen Huang, Ling Yang, Ta-Hone Yang, Kuang-Chao Chen |
2018-01-16 |
|
| 9589086 |
Method for measuring and analyzing surface structure of chip or wafer |
Hsiang-Chou Liao, Ling Yang, Ta-Hone Yang, Kuang-Chao Chen |
2017-03-07 |
|
| 9244112 |
Method for detecting an electrical defect of contact/via plugs |
Hsiang-Chou Liao, Ling Yang, Ta-Hone Yang, Kuang-Chao Chen |
2016-01-26 |
|
| 9116108 |
Electron beam inspection optimization |
Ling Yang, Ta-Hone Yang, Kuang-Chao Chen |
2015-08-25 |
|
| 9006003 |
Method of detecting bitmap failure associated with physical coordinate |
Chi-Min Chen, Ling Yang, Ta-Hone Yang, Kuang-Chao Chen |
2015-04-14 |
|
| 8828861 |
Method for fabricating conductive lines of a semiconductor device |
Ming-Da Cheng, Chin-Ta Su, Tahone Yang, Kuang-Chao Chen |
2014-09-09 |
|
| 8669184 |
Method for improving flatness of a layer deposited on polycrystalline layer |
Ling-Wu Yang, Ta-Hone Yang, Kuang-Chao Chen |
2014-03-11 |
|
| 8653592 |
Isolation structure, non-volatile memory having the same, and method of fabricating the same |
Ming-Da Cheng, Chin-Tsan Yeh, Chin-Ta Su, Ta-Hung Yang, Kuang-Chao Chen |
2014-02-18 |
|
| 8594963 |
In-line inspection yield prediction system |
Hsiang-Chou Liao, Che-Lun Hung, Ling Yang, Ta-Hone Yang, Kuang-Chao Chen |
2013-11-26 |
|
| 8580680 |
Metal silicide formation |
Sheng-Hui Hsieh, Ricky Huang, Chin-Ta Su, Tahone Yang, Kuang-Chao Chen |
2013-11-12 |
|
| 8519541 |
Semiconductor device having plural conductive layers disposed within dielectric layer |
Chin-Ta Su, Ta-Hung Yang, Kuang-Chao Chen |
2013-08-27 |
|
| 8520194 |
Method of forming a deposited material by utilizing a multi-step deposition/etch/deposition (D/E/D) process |
Sheng-Hui Hsieh, Shing-Ann Luo, Chin-Ta Su, Ta-Hung Yang, Kuang-Chao Chen |
2013-08-27 |
|
| 8383515 |
Methodology for wordline short reduction |
Ling-Wu Yang, Tahone Yang, Kuang-Chao Chen |
2013-02-26 |
|
| 8329480 |
Test pattern for detecting piping in a memory array |
Che-Lun Hung, Hsiang-Chou Liao, Ling-Wu Yang |
2012-12-11 |
|
| 8184288 |
Method of depositing a silicon-containing material by utilizing a multi-step fill-in process in a deposition machine |
Sheng-Hui Hsieh, Shing-Ann Luo, Chin-Ta Su, Ta-Hung Yang, Kuang-Chao Chen |
2012-05-22 |
|
| 8085390 |
Multivariate monitoring method for plasma process machine |
Shing-Ann Luo, Chin-Ta Su, Ta-Hung Yang, Kuang-Chao Chen |
2011-12-27 |
|
| 8067292 |
Isolation structure, non-volatile memory having the same, and method of fabricating the same |
Ming-Da Cheng, Chin-Tsan Yeh, Chin-Ta Su, Ta-Hung Yang, Kuang-Chao Chen |
2011-11-29 |
|
| 8034691 |
HDP-CVD process, filling-in process utilizing HDP-CVD, and HDP-CVD system |
Chin-Ta Su, Ta-Hung Yang, Kuang-Chao Chen, Shing-Ann Luo |
2011-10-11 |
|
| 8003519 |
Systems and methods for back end of line processing of semiconductor circuits |
Chi-Tung Huang, Kuang-Chao Chen, Candy Jiang |
2011-08-23 |
|
| 7951707 |
Etching method for semiconductor element |
Ling Yang, Kuang-Chao Chen |
2011-05-31 |
|
| 7938972 |
Fabrication method of electronic device |
Ling Yang, Kuang-Chao Chen |
2011-05-10 |
|
| 7888804 |
Method for forming self-aligned contacts and local interconnects simultaneously |
Ling Yang, Kuang-Chao Chen |
2011-02-15 |
|