Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9589086 | Method for measuring and analyzing surface structure of chip or wafer | Tuung Luoh, Ling Yang, Ta-Hone Yang, Kuang-Chao Chen | 2017-03-07 |
| 9244112 | Method for detecting an electrical defect of contact/via plugs | Tuung Luoh, Ling Yang, Ta-Hone Yang, Kuang-Chao Chen | 2016-01-26 |
| 8594963 | In-line inspection yield prediction system | Che-Lun Hung, Tuung Luoh, Ling Yang, Ta-Hone Yang, Kuang-Chao Chen | 2013-11-26 |
| 8329480 | Test pattern for detecting piping in a memory array | Che-Lun Hung, Tuung Luoh, Ling-Wu Yang | 2012-12-11 |