Issued Patents All Time
Showing 1–15 of 15 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12265907 | System and method for predicting domain reputation | Mauritius A. Schmidtler, Chahm An, Hal Lonas, Catherine Yang, Trung Tran | 2025-04-01 |
| 11980448 | Apparatus and methods of monitoring maternal and fetal heart rate | — | 2024-05-14 |
| 11533243 | Method for computing environment specific baselines for metrics of user experience | Andreas Varnavas, Venkatesh Vellingiri | 2022-12-20 |
| 11089091 | Heuristics for selecting nearest zone based on ICA RTT and network latency | — | 2021-08-10 |
| 10476946 | Heuristics for selecting nearest zone based on ICA RTT and network latency | — | 2019-11-12 |
| 10423523 | Automated selection of test cases for regression testing | Madhusudhan Ganda, Sumit Gupta, Pradeep Kumar Kanagaraj, Swapnel Shrivastava, Narendra Dhulipalla +1 more | 2019-09-24 |
| 10313289 | Observation platform using structured communications with external devices and systems | Ravi Shankar Kumar, Guy R. VanBuskirk, Steven M. Lucy, Shiva Cheedella, Ashok Donthe Manjunath | 2019-06-04 |
| 10069781 | Observation platform using structured communications with external devices and systems | Ravi Shankar Kumar, Guy R. VanBuskirk, Steven M. Lucy, Shiva Cheedella, Ashok Donthe Manjunath | 2018-09-04 |
| 8869289 | Software application verification | Kedarnath A. Dubhashi, John A. Bocharov, Hany Farag, Gilles Khouzam | 2014-10-21 |
| 6767832 | In situ liner barrier | Zhihai Wang, Wilbur G. Catabay, Kai Zhang | 2004-07-27 |
| 6518193 | Substrate processing system | Zhihai Wang, Rudy Rios, Wilbur G. Catabay, Richard Schinella | 2003-02-11 |
| 6503840 | Process for forming metal-filled openings in low dielectric constant dielectric material while inhibiting via poisoning | Wilbur G. Catabay, Wei-Jen Hsia, Hong-Qiang Lu, Yong-Bae Kim, Kai Zhang +2 more | 2003-01-07 |
| 6489231 | Method for forming barrier and seed layer | Zhihai Wang, Wilbur G. Gatabay | 2002-12-03 |
| 6066561 | Apparatus and method for electrical determination of delamination at one or more interfaces within a semiconductor wafer | David J. Heine | 2000-05-23 |
| 5174946 | Oscillation power monitoring system and method for nuclear reactors | Glen Alan Watford | 1992-12-29 |